| Beamline |
Technique(s) |
Energy Range |
Spokesperson |
| U1A |
X-ray absorption spectroscopy
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
|
270-900 eV |
Paul Stevens |
| U2A |
Infrared microspectroscopy
High Pressure Research
Infrared vibrational spectroscopy
|
30-10000cm-1 (to 40000cm-1 with visible light) |
G Carr |
| U2B |
Infrared microspectroscopy
Infrared vibrational spectroscopy
|
50-4000 cm-1 |
Mark Chance |
| U3C |
Metrology
|
50-1000 eV |
Franz Weber |
| U4B |
X-ray scattering, resonant
Magnetic circular dichroism
Ultraviolet photoelectron spectroscopy
X-ray fluorescence spectroscopy
X-ray photoelectron spectroscopy
|
20-1200 eV |
Dario Arena |
| U5UA |
Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
Ultraviolet photoelectron spectroscopy (UPS), spin-resolved
|
15-150 eV |
Elio Vescovo |
| U7A |
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
X-ray photoelectron spectroscopy
|
180-1200 eV |
Daniel Fischer |
| U9B |
Time-resolved spectroscopy
Ultra violet circular dichroism
Ultraviolet florescence spectroscopy
|
0.8 - 8.0 eV |
John Sutherland |
| U10B |
Infrared microspectroscopy
|
500-4000 cm-1 |
Lisa Miller |
| U11 |
Ultra violet circular dichroism
|
3-10 eV |
John Sutherland |
| U12A |
X-ray absorption spectroscopy
X-ray photoelectron spectroscopy
|
100-800 eV |
David Mullins |
| U12IR |
Infrared transmission and reflection spectrospcopy
Magnetospectroscopy
THz / millimeter wave spectroscopy
Time-resolved spectroscopy
|
8-600 cm-1 |
G Carr |
| U13UB |
Ultraviolet photoelectron spectroscopy
Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
|
3-30 eV |
Peter Johnson |
| X1A1 |
Scanning transmission x-ray microscopy
X-ray absorption spectroscopy, near edge structure
|
.25-.50 keV |
Chris Jacobsen |
| X1A2 |
Scanning transmission x-ray microscopy
|
.25-1 keV |
Chris Jacobsen |
| X1B |
X-ray scattering, coherent
X-ray absorption spectroscopy
X-ray fluorescence spectroscopy
X-ray photoelectron spectroscopy
|
.2-1.6 keV |
Peter Abbamonte |
| X2B |
X-ray microtomography
|
8-35 keV |
John Dunsmuir |
| X3A |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
4.6-15.1 keV |
Mark Chance |
| X3B |
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
|
5-13.7 keV |
Mark Chance |
| X4A |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
3.5-20 keV |
Wayne Hendrickson |
| X4C |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
7-20 keV |
Wayne Hendrickson |
| X6A |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
6.0-23 keV or 2.1 to 0.54 angstroms |
Vivian Stojanoff |
| X6B |
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
|
6.5-19 keV |
Elaine Dimasi |
| X7B |
X-ray diffraction, single crystal
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, wide angle
|
5-21 keV |
Jose Rodriguez |
| X8A |
Metrology
|
1.0-5.9 keV |
Franz Weber |
| X8C |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
5-19 keV |
Mirek Cygler |
| X10A |
X-ray diffraction, powder
X-ray diffraction, wide angle
X-ray scattering, small angle
X-ray scattering, wide angle
|
8-11 keV |
Paul Stevens |
| X10B |
X-ray diffraction, powder
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
X-ray scattering, wide angle
|
14 keV |
Paul Stevens |
| X10C |
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
|
4-24 keV |
Paul Stevens |
| X11A |
X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
|
4.5-35 keV |
Devicharan Chidambaram |
| X11B |
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, near edge structure
|
5.0-23 keV |
Devicharan Chidambaram |
| X12B |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
5-20 keV |
Dieter Schneider |
| X12C |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
5.5-20.0 keV |
Robert Sweet |
| X13A |
X-ray scattering, magnetic
X-ray scattering, resonant
Magnetic circular dichroism
|
.2-1.6 keV |
Cecilia Sanchez Hanke |
| X13B |
Microdiffraction Imaging
|
4-16 KeV |
Kenneth Evans-Lutterodt |
| X14A |
Multi wavelength anomalous diffraction
X-ray diffraction, powder
X-ray diffraction, single crystal
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray reflectivity
|
5-26 keV |
Camden Hubbard |
| X15A |
X-ray diffraction, standing waves
Diffraction enhanced imaging
|
3-25keV XSW, 10-60keV DEI |
Zhong Zhong |
| X15B |
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
|
0.8-15 keV, standard 2-5 |
Paul Northrup |
| X16C |
X-ray diffraction, powder
|
6.5-25 keV |
Peter Stephens |
| X17B1 |
X-ray diffraction, powder
|
55 - 80 keV monochromatic / 20-150 keV white |
Zhong Zhong |
| X17B2 |
X-ray diffraction, powder
X-ray diffraction, time resolved
High Pressure Research
|
Hard X-ray (20-130 keV) |
Zhong Zhong |
| X17B3 |
X-ray diffraction, powder
X-ray diffraction, single crystal
High Pressure Research
|
5-80 keV |
Zhong Zhong |
| X17C |
X-ray diffraction, powder
X-ray diffraction, single crystal
High Pressure Research
|
5-80 keV |
Zhong Zhong |
| X18A |
X-ray diffraction, powder
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
X-ray scattering, wide angle
|
4-19 keV |
Steven Ehrlich |
| X18B |
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
|
4.8-40 keV |
Steven Ehrlich |
| X19A |
X-ray scattering, resonant
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
|
2.1-17 keV |
Steven Ehrlich |
| X19C |
X-ray diffraction, surface
X-ray topography
X-ray reflectivity
X-ray scattering, liquid
X-ray scattering, surface
|
6-17 keV |
Mark Schlossman |
| X20A |
X-ray diffraction, single crystal
X-ray diffraction, wide angle
Microdiffraction Imaging
X-ray reflectivity
X-ray scattering, surface
|
4.5-13 keV |
Jean Jordan-Sweet |
| X20C |
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray diffraction, time resolved
X-ray reflectivity
X-ray scattering, surface
|
7-11 keV (Si(111));4-11 keV (multilayers) |
Jean Jordan-Sweet |
| X21 |
X-ray diffraction, single crystal
X-ray scattering, magnetic
X-ray scattering, resonant
X-ray scattering, small angle
|
5-15 keV |
Christie Nelson |
| X22A |
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
X-ray scattering, wide angle
|
10.7 keV (nom) and 32keV |
Benjamin Ocko |
| X22B |
X-ray scattering, liquid
|
6.5-10 keV |
Benjamin Ocko |
| X22C |
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray reflectivity
X-ray scattering, magnetic
X-ray scattering, surface
|
3-12 keV |
Benjamin Ocko |
| X23A2 |
X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
|
4.7-30 keV |
Joseph Woicik |
| X23B |
X-ray diffraction, powder
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
|
4-10.5 keV |
Richard Everett |
| X24A |
X-ray diffraction, standing waves
Auger spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray fluorescence spectroscopy
X-ray photoelectron spectroscopy
|
1.8-5 keV |
Daniel Fischer |
| X24C |
X-ray reflectivity
Ultraviolet photo absorption spectroscopy
X-ray absorption spectroscopy
|
.006-1.8 keV |
Jack Rife |
| X25 |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
5-20 keV |
Lonny Berman |
| X26A |
Microdiffraction Imaging
X-ray microprobe
|
3-30 keV |
Stephen Sutton |
| X26C |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
5-20 keV |
Dieter Schneider |
| X27A |
X-ray microprobe
|
4.5-32 keV |
Lisa Miller |
| X27B |
High aspect ratio microsystems technology
|
8 - 40 keV |
Ralph James |
| X27C |
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, small angle
X-ray scattering, wide angle
|
9 KeV |
Benjamin Hsiao |
| X28C |
X-ray Footprinting
|
Focused White Beam |
Mark Chance |
| X29A |
Multi wavelength anomalous diffraction
Macromolecular crystallography
|
6-15keV |
Robert Sweet |
