X11A External Homepage
Beamline X11A
General Information
Source Type Bending Magnet Status Operational General User Beamtime 25% Energy Range Category Hard X-Ray (1-50 keV) Energy Range 4.5-35 keV
Beamline Type Participating Research Team (PRT) Technique(s) X-ray diffraction, anomalous fine structure X-ray absorption spectroscopy X-ray absorption spectroscopy, extended fine structure X-ray absorption spectroscopy, fine structure X-ray absorption spectroscopy, near edge fine structure X-ray absorption spectroscopy, near edge structure
Institution(s) Brookhaven National Laboratory, Material Sciences Department Brookhaven National Laboratory, Environmental Science Dept. Canadian Light Source ETH Labs - Zuerich Natural Resources Canada Naval Research Laboratory (NRL) Naval Surface Warfare Center New Jersey Institute of Technology North Carolina State University SUNY @ Stony Brook, CEMS Sarah Lawrence College
Research Types EXAFS of materials and chemical systems in nominal energy range of 4.5-35 keV Techniques: XAFS, DAFS.
Contact Information
Spokesperson ![The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.](https://webarchive.library.unt.edu/eot2008/20080916095505im_/http://www.nsls.bnl.gov/images/icons/definition_sm.gif)
Devicharan Chidambaram, Brookhaven National Laboratory, devc@bnl.gov, 344-2643
Local Contact ![The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.](https://webarchive.library.unt.edu/eot2008/20080916095505im_/http://www.nsls.bnl.gov/images/icons/definition_sm.gif)
Kaumudi Pandya, SFA, Inc., pandya@bnl.gov, 6313447734
Beamtime Scheduler ![The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.](https://webarchive.library.unt.edu/eot2008/20080916095505im_/http://www.nsls.bnl.gov/images/icons/definition_sm.gif)
Kaumudi Pandya, SFA, Inc., pandya@bnl.gov, 6313447734
Beamline Phone
631-344-5611
Instrumentation
Beamline Characteristics
Energy Range |
Mono Crystal or Grating |
Resolution (ΔE/E) |
Flux |
Spot Size (mm) |
Total Angular Acceptance (mrad) |
4.5 – 26 keV |
Si(111) |
2 x 10-4 |
1 x 1011 ph/sec (@ 10 keV , 350mA, 2.58 GeV) |
10H x 0.5V (unfocused) |
0.5 |
8 – 35 keV |
Si(311) |
2 x 10-4 |
|
10H x 0.5V (unfocused) |
0.5 |
Source Type Bending magnet Optical System Be Window. Channel-cut two-crystal monochromator. Experimental Apparatus 13-element Si-Li Detector. Displex shared with X-11B. Lytle Fluorescence Detector.
Computer System Hardware & Software Apple Mac G4 with Mac OS 9, XDAC spectroscopy data acquisition software.
Links
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