Find people (by last name)


Advanced search

Beamline X23B

General Information

Source Type
Bending Magnet

Status
Operational

General User Beamtime
25%

Energy Range Category
Hard X-Ray (1-50 keV)

Energy Range
4-10.5 keV

Beamline Type
Participating Research Team (PRT)

Technique(s)
X-ray diffraction, powder
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure

Institution(s)
Hunter College
National Institute of Standards & Technology
Naval Research Laboratory (NRL)
Naval Surface Warfare Center, Indian Head Division
New Jersey Institute of Technology
Northeastern University
Sarah Lawrence College

Research Types
EXAFS and diffraction of materials and chemical systems in nominal energy range.

Contact Information

Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
Richard Everett, Naval Research Laboratory (NRL), everett@anvil.nrl.navy.mil, 202/767-2264

Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
Johnny Kirkland, SFA, Inc., kirkland@bnl.gov, 631/344-2258

Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
Johnny Kirkland, SFA, Inc., kirkland@bnl.gov, 631/344-2258

Beamline Phone
631-344-5723

Instrumentation

Beamline Characteristics

Energy Range Mono Crystal or Grating Resolution (ΔE/E) Flux Spot Size (mm) Total Angular Acceptance (mrad)
3.8 – 11 keV Si(111) 2 x 10-4 (measured @ 5.8 keV) 4.4 x 1011 (measured @ 7 keV, 2.8 GeV, normalized to 250 mA) 2.0H x 2.0V (measured) 6
      5.0 x 1011 (measured @ 8 keV, 2.8 GeV, normalized to 250 mA)    
      4.8 x 1011 (measured @ 9 keV, 2.8 GeV, normalized to 250 mA)    
      4.1 x 1011 (measured @ 10 keV, 2.8 GeV, normalized to 250 mA)    
      1.8 x 1011 (measured @ 11 keV, 2.8 GeV, normalized to 250 mA)    

Source Type
Bending magnet

Optical System
Mirror 1: Platinum-coated flat silicon collimating mirror; 400 mm long by 70 mm wide; collimation achieved by four point bending; high energy cutoff is 11 keV; angle of incidence is 7.15 mradians; located 7.9 meters from the source.

Monochromator: Fixed-exit-position double-crystal monochromator (Cowan type); two ranges of incident angle are 8 - 15 degrees and 13.5 - 70 degrees; located 9.2 meters from the source.

Mirror 2: Platinum-coated quartz toroidal mirror; 580 mm long by 70 mm wide and sagittal radius of 84 mm; vertical focusing achieved by four point bending; focal point at 23.5 meters from the source; angle of incidence is 7.15 mradians; high energy cutoff is 11 keV; located 11.75 meters from the source.

Experimental Apparatus
Displex; Detectors for transmission, fluorescence EXAFS; Four circle Huber diffractometer.

Computer System Hardware & Software
Apple Mac G4 with Mac OS 9, XDAC spectroscopy data acquisition software.

Links