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X22A External Homepage

Beamline X22A

General Information

Source Type
Bending Magnet

Status
Operational

General User Beamtime
25%

Energy Range Category
Hard X-Ray (1-50 keV)

Energy Range
10.7 keV (nom) and 32keV

Beamline Type
Participating Research Team (PRT)

Technique(s)
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
X-ray scattering, wide angle

Institution(s)
Brookhaven National Laboratory, Chemistry
Brookhaven National Laboratory, CMPMSD, X-ray scattering

Research Types
X-ray scattering of thin organic and biomolecular material films, multilayers, catalytic materials, electrochemical interfaces, biomineral interfaces and single crystal x-ray diffraction..

Contact Information

Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
Benjamin Ocko, Brookhaven National Laboratory, ocko@bnl.gov, 344-4299

Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
John Hill, Brookhaven National Laboratory, hill@bnl.gov, 344-3736
Benjamin Ocko, Brookhaven National Laboratory, ocko@bnl.gov, 344-4299

Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
John Hill, Brookhaven National Laboratory, hill@bnl.gov, 344-3736

Beamline Phone
631-344-5622

Instrumentation

Beamline Characteristics

Energy Range Mono Crystal or Grating Resolution (ΔE/E) Flux Spot Size (mm) Total Angular Acceptance (mrad)
10 keV (+- 500 eV) Si(111) ~2 x 10-3 ~1011 ph/sec 0.2H x 0.2 V 2.1

Source Type
Bending magnet

Optical System
Mirror: Platinum-coated flat mirror focusing in the vertical. Located 7.9 meters from the source.

Monochromator: Sagitally focusing Si(111) crystal monochromator scattering in the horizontal. Located at 12.4 m from the source.

Sample Position: Located at 14.56 m from the source.

Experimental Apparatus
Spectrometer: Huber 6-circle, vertical scattering.

Computer System Hardware & Software
Computer: PC/AT Compatable, Linux OS

Beam Line Controls: VME and GPIB; SPEC control software (by Certified Scientific Software)

Links