Find people (by last name)


Advanced search

Beamline X6B

General Information

Source Type
Bending Magnet

Status
Operational

General User Beamtime
50%

Energy Range Category
Hard X-Ray (1-50 keV)

Energy Range
6.5-19 keV

Beamline Type
Facility Beamline

Technique(s)
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity

Institution(s)
Brookhaven National Laboratory CFN
NSLS

Research Types
X-ray scattering, reflectivity, and diffraction from soft- and bio-materials; diffractive SAXS and GISAXS. Combinatorial materials science. Interface strucctures.

Contact Information

Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
Elaine Dimasi, Brookhaven National Laboratory, dimasi@bnl.gov, 344-2211

Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
Elaine Dimasi, Brookhaven National Laboratory, dimasi@bnl.gov, 344-2211

Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
Elaine Dimasi, Brookhaven National Laboratory, dimasi@bnl.gov, 344-2211

Beamline Phone
631-344-4069

Instrumentation

Beamline Characteristics

Energy Range Mono Crystal or Grating Resolution (ΔE/E) Flux Spot Size (mm) Total Angular Acceptance (mrad)
6.5 – 20 keV (focused); 6.5 - 40 (unfocused) Si(111) 2.0 x 10-4 (@ 8 keV) unmeasured 0.3H x 0.3V (focused); 60H x 3V (unfocused) 3.0

Source Type
Bending magnet

Optical System
Monochromator: Si (111) channel-cut located 10 m from source. Focusing Mirror: Rhodium-plated bent cylindrical Si single crystal for 1:1 focusing at sample located 11.3 m from source.

Experimental Apparatus
Radiation hutch. 6-circle Huber 5020 diffractometer with vertical scattering geometry. Computer-controlled table for Huber. Ion chambers, NaI detector, Princeton Instruments CCD area detector, Si strip detector (shared with X9). Two-circle analyzer stage with Ge(111) crystal analyzer. Beamstops with photodiodes for through measurement when using CCD.

Computer System Hardware & Software
Pentium class computer running Linux for beamline optics, Huber and table; Pentium-class computer running Windows for CCD; VME crate interface for beamline control and scaler data acquisition.

Links