X26A External Homepage
Beamline X26A
General Information
Source Type Bending Magnet Status Operational General User Beamtime 25% Energy Range 3-30 keV
Beamline Type Participating Research Team (PRT) Technique(s) Microdiffraction Imaging X-ray microprobe
Institution(s) Brookhaven National Laboratory, Enironmental Sciences University of Chicago University of Georgia
Research Types Develop and apply a synchrotron-based x-ray microprobe. Techniques: Synchrotron x-ray fluorescence microanalysis, microspectroscopy (including XAS), and microdiffraction in geochemistry, environmental science, chemistry, biology, and other fields.
Contact Information
Spokesperson ![The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.](https://webarchive.library.unt.edu/eot2008/20080916095939im_/http://www.nsls.bnl.gov/images/icons/definition_sm.gif)
Stephen Sutton, University of Chicago, SUTTON@CARS.UCHICAGO.EDU, 630-252-0426
Local Contact ![The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.](https://webarchive.library.unt.edu/eot2008/20080916095939im_/http://www.nsls.bnl.gov/images/icons/definition_sm.gif)
Antonio Lanzirotti, University of Chicago, LANZIROTTI@BNL.GOV, 631-344-7174 (BNL)
Beamtime Scheduler ![The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.](https://webarchive.library.unt.edu/eot2008/20080916095939im_/http://www.nsls.bnl.gov/images/icons/definition_sm.gif)
Antonio Lanzirotti, University of Chicago, LANZIROTTI@BNL.GOV, 631-344-7174 (BNL)
Beamline Phone
631-344-5626
Instrumentation
Beamline Characteristics
Energy Range |
Mono Crystal or Grating |
Resolution (ΔE/E) |
Flux |
Spot Size (mm) |
Total Angular Acceptance (mrad) |
3 – 40 keV |
Unfocused White Beam |
|
unmeasured |
25H x 2V |
3.0 |
4 - 18 keV |
Focused White Beam |
|
unmeasured |
0.15H x 0.35V |
0.5 |
4 - 30 keV |
Unfocused Mono, Si(111) and Si(311) |
2 x -4 |
unmeasured |
25H x 2V |
3.0 |
4 - 30 keV |
Focused Mono, Si(111) and Si(311) |
2 x -4 |
3 x 9 ph/sec |
0.011H x 0.005V |
0.5 |
Source Type Bending magnet Optical System Microfocusing optics consisting of two, 100 mm long, dynamically bent silica mirrors arranged in a Kirkpatrick-Baez (KB) geometry (designed and built by P. Eng, CARS-University of Chicago). The KB mirrors (40:1, 9 meters from the source) focus a 400 x 400 m beam down to about 5-10 m (FWHM) resulting in a gain in flux/µm^2 of about 1500 over a pinhole. Photon Flux at 18 keV is roughly 1x109 photons/sec in focused monochromatic mode. The focusing mirrors are Rh coated and reside inside a He enclosure. The beamline can also be operated using a pinhole collimator (~5 m beam) or an 8:1 ellipsoidal focusing mirror (~150 m beam). Experimental Apparatus Radiation hutch; 9-element Ge Array and Si(Li) x-ray detectors, both Canberra, using either XIA DXP digital multi channel analyzer systems or 9615/AIM analog electronics; Ion chamber and PIN diode detectors; Wavelength dispersive spectrometer (deltaE/E ~ 10-3); XYZ-theta sample position stage; Remote optical microscope with Mitutoyo infinity-corrected long working distance objectives; Microdiffraction capabilities using Bruker SMART 1500 CCD detector. Computer System Hardware & Software Three PC workstations operating Windows NT, 2000, and XP Pro OS systems, fastest operating at 3 GHz w/ 1 GHz RAM. One Apple Power Mac G5 (Power PC 970, 1.6 GHz) using Mac OS X Panther as EPICS boot host. Hard disk, CD-R/W, DVD-R/W, USB 2.0 Multi-Card Reader, 20Gb Travan tape data storage options. EPICS Control System using an MEDM front-end. VME and CAMAC system monitors, Ethernet data access and acquisition, Interactive Data Language (IDL) software, optical and digital image capture and processing system with hardcopy. Bruker SMART diffractometer control system.
Links
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