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Capabilities

Spectroscopy and Diffraction

A suite of spectroscopy and diffraction instruments in EMSL allow users to study solid-, liquid-, and gas-phase sample structure and composition with remarkable resolution. Ideal for integrated studies, spectrometers and diffractometers are easily coupled with EMSL's computational and modeling capabilities, allowing EMSL users to apply a multifaceted research approach for experimental data interpretation and to gain a fundamental understanding of scientific problems. At EMSL, spectroscopy and diffraction instruments are used to study samples with a wide range of applications.

Capability Detail

Refer to the table below for a full listing, which leads to complete information about each of EMSL's spectroscopy and diffraction instruments. Brief details about some primary spectroscopy and diffraction tools available to EMSL users immediately follow.

  1. One-Electron-Transfer Reactions of Polychlorinated Ethylenes: Concerted and Stepwise Cleavages.
  2. Investigation of the hygroscopic growth of self-assembled layers of N-alkyl-N-methylpyrrolidinium bromides at the interface between air and organic salt .
  3. Apoferritin-Templated Yttrium Phosphate Nanoparticle Conjugates for Radioimmunotherapy of Cancers.
  4. Sensitive electrochemical immunoassay for 2,4,6-trinitrotoluene based on functionalized silica nanoparticle labels.
  5. Characterization and Acid-Mobilization Study of Iron-Containing Mineral Dust Source Materials.
  1. The Synergy Between Molecular Theory and Solid-State NMR Spectroscopy (Model System for NMR)
  2. A New Mechanism for Ozonolysis of Unsaturated Organics on Solids: Phosphocholines on NaCl as a Model for Sea Salt Particles (Up in the Air)
  3. Conductivity of Oriented Samaria-Doped Ceria Thin Films Grown by Oxygen-Plasma-Assisted Molecular Beam Epitaxy (The Good Samaria)

Spectroscopy and Diffraction Capabilities Available at EMSL

Instrument Contact
Electron Spectrometer: Auger/Scanning Auger Lea, Scott
Electron Spectrometer: HREELS, UHV Surface Chemistry Henderson, Mike
Electron Spectrometer: XPS/AES (Kratos multitechnique) Kim, Do Heui
Electron Spectrometer: Scanning Multiprobe Surface Analysis System - Versaprobe Engelhard, Mark
Electron Spectrometer: XPS High Resolution (Quantum) Engelhard, Mark
Electron Spectrometer: XPS with laser interface Beck, Kenneth M.
Ion Accelerator, Beam Lines, and End Stations Shutthanandan, Shuttha
Microscope: Raman Confocal Hess, Nancy J.
Photoelectron Spectroscopy - Electrospray Source Beck, Kenneth M.
Photoelectron Spectroscopy - Low Temperature Joly, Alan G
Photoelectron Spectroscopy of Atomic Clusters - Laser Vaporization Source Beck, Kenneth M.
Spectrometer: Fluorimeter Wang, Zheming
Spectrometer: Mossbauer Kukkadapu, Ravi
Spectrometer: circular dichroism Isern, Nancy
Spectrometer: Fluorescence, cryogenic Wang, Zheming
Spectrometer: Fluorescence, picosecond Joly, Alan G
Spectrometer: FTIR - HR Blake, Tom
Spectrometer: FTIR - standard Gassman, Paul
Johnson, Tim
Spectrometer: Stopped-Flow, Absorbance, BioLOGIC SFM-400 Wang, Zheming
Spectroscopy: Fluorescence, time-resolved Wang, Zheming
Surface Dynamics/Ion Deposition System Cowin, Jim
X-ray Diffraction: Four-Circle Nachimuthu, Ponnusamy
X-ray Diffraction: General Purpose Nachimuthu, Ponnusamy
X-ray Diffraction: microbeam Nachimuthu, Ponnusamy
X-ray Diffraction: Single Crystal Thompson,Michael R
X-ray Diffraction: Special Applications Nachimuthu, Ponnusamy
Spectroscopy and Diffraction Capability Steward (Electron and Ion/Molecular Beam): Theva Thevuthasan | , 509-371-6244
Spectroscopy and Diffraction Capability Steward (Infrared): Roy Gephart | , 509-371-6142
Spectroscopy and Diffraction Capability Steward (Mössbauer, Optical, and X-ray Diffractometer): Nancy Hess | , 509-371-6385