Scanning Electron Microscopes
- JEOL 6500 FEG-SEM with SDD-EDS and OIM/EBSD
Contact: Shawn Reeves, 18x@ornl.gov - Hitachi NB5000 FIB-SEM with EDAX Pegasus integrated SDD-EDS and OIM-EBSD
Contact: Chad Parish, parishcm@ornl.gov - Hitachi S4800 FEG-SEM with EDAX Genesis SDD-EDS
Contact: Donovan Leonard, leonarddn@ornl.gov