Hitachi S4800 FEG-SEM with EDAX Genesis SDD-EDS

• ≤2nm resolution
• EDAX Genesis SDD (30mm²)
• Mechanical testing modules(compression, flexure & fracture toughness)

Current Research Activities

• Microstructural design of materials
• Interface dominated phenomena
• Fracture and deformation processes

Contact:

Donovan Leonard, leonarddn@ornl.gov - (865) 574-5067