Proximal Probes Facility
Contact: Peter Sutter
The Interface Science and Catalysis Group operates a comprehensive suite of state-of-the-art instruments for microscopy,
spectroscopy, and probing of nanostructured surfaces and surface-supported nanostructures. Capabilities include atomic-resolution
surface microscopy and spectroscopy, probing and mapping of electrical and optical properties, and real-time imaging and spectroscopy
of surfaces during chemical reactions or nanostructure growth.
The instruments span the range between complex systems operating in ultrahigh vacuum (UHV) and characterization tools for
operation in air or in controlled ambient. The UHV instruments are equipped for in-situ sample preparation and modification, and
for routine characterization by diffraction and electron and ion spectroscopy techniques. Each ambient instrument enables multiple
measurement techniques to serve a broad range of User needs.
Capabilities
Low-energy electron microscopy & photoelectron microscopy
Contact: Jerzy Sadowski (sadowski@bnl.gov)
- Elmitec LEEM V field-emission low-energy electron microscope for in-situ microscopy of dynamic surface processes. Micro-diffraction capability.
Operation at variable temperature (200 K to over 1500 K), and at pressures from UHV to about 10-6 torr.
- Elmitec LEEM III low-energy electron microscope, coupled to vacuum-UV beamline U5UA at the National Synchrotron Light Source, for time-resolved
and spectroscopic surface microscopy, photoelectron microscopy and spectroscopy (photon energy range: 20 – 200 eV), micro-diffraction.
Probing of transport and photoelectric properties of single nanostructures
Contact: Peter Sutter (psutter@bnl.gov)
- Omicron Nanotechnology 4-Point Nanoprobe with Zeiss Gemini UHV field-emission scanning electron microscope, scanning Auger microscopy spectroscopy,
integrated Orsay Physics UHV focused ion beam system, and low-energy electron diffraction.
- Attocube confocal microscope for operation in He exchange gas at variable temperature (4 K to 300 K) in magnetic fields up to 10 T.
UHV and elevated pressure microscopy & spectroscopy
Contact: David Starr (dstarr@bnl.gov)
- RHK Technology UHV 7500 variable temperature UHV atomic force and scanning tunneling microscope equipped for operation in UHV as well as in reactive
gases at pressures up to ~10 torr; preparation chamber equipped with low-energy electron diffraction, x-ray photoelectron spectroscopy, and ion scattering
spectroscopy.
- Currently under construction: High-pressure photoelectron spectroscopy end station at the National Synchrotron Light Source, for XPS and UPS at pressures
up to ~10 torr; UHV sample preparation and characterization in an attached preparation chamber.
Cryogenic scanning tunneling microscopy
Contact: Peter Sutter (psutter@bnl.gov)
- Createc low-temperature UHV scanning tunneling microscope for operation with liquid helium (T ~ 5 K) or liquid nitrogen (T ~ 80 K) cooling; high-resolution
microscopy, ultrastable tunneling spectroscopy, single atom and molecule manipulation. Sample preparation chamber equipped with liquid helium cooled
manipulator and low-energy electron diffraction.
Scanning probe and optical microscopes for operation in air and controlled ambient
Contact: Percy Zahl (pzahl@bnl.gov)
- Veeco Multimode V scanning probe microscope for operation at variable temperature in air, controlled ambients, and fluids. Special cell for electrochemical
scanning tunneling microscopy.
- WiTec Alpha combination microscope for atomic force microscopy, scanning near-field optical microscopy, confocal microscopy, and confocal Raman microscopy
within the same field of view. Two laser excitation sources (633 nm and 532 nm) for confocal and confocal Raman microscopy. Operation between room
temperature and 200°C.
Last Modified: May 6, 2008
Please forward all questions about this site to:
Stephen Giordano.
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