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AND/R ADVANCED NEUTRON DIFFRACTOMETER / REFLECTOMETER

The AND/R instrument shown in polarized beam mode with position sensitive detector.  Note: some shielding is omitted from the figure for illustrative purposes The AND/R instrument shown in polarized beam mode with position sensitive detector.  Note: some shielding is omitted from the figure for illustrative purposes

Two views of the AND/R instrument. (Click image for a large view.) Note: some shielding is omitted from the figure for illustrative purposes.

Labeled Elevation of AND/R :: Floor Plan of the AND/R and NG1 Reflectometer Area

Instrument Paper describing ANDR (and vertical sample reflectometers in general)

The Reflectometer
- AND/R description and characteristics
- Reflectivity Formalism
- Instrument Schedule
- Obtaining Beamtime

Research
- ANDR Publications
- Biology
- Surfaces and Nanofilms

Data Analysis
- Overview
- Download ReflPak
- SLD Calculator

Support

Refrigerators, furnaces, magnets, liquid cells, and lasers are available for control of sample environment. On-site x-ray reflectometry is available for additional sample characterization. If you're interested in performing an experiment, apply for beamtime, or contact one of the instrument scientists directly. Monetary assistance may be available for new facility users.

MAGIK: new instrument development

As part of the new guide hall expansion project, the AND/R instrument will be converted into a dedicated off-specular reflectivity instrument: MAGIK
The detector and detector carriage will be replaced, and a continuous-polarization 3He spin analyzer will be added.
accessible within NIST only: the MAGIK development blog


Instrument Scientists


Last modified 18-July-2008