A127 | E131 | E132 | E133 | E134 | E136 | E137 | E138
Bath - Circulating |
Pump - Peristaltic |
Table - Vibration Isolation
Langmuir Trough |
Microscope |
X-Ray - Reflectivity |
X-Ray - Residual Stress
Bath - Circulating
NESLAB RTE-7Specifications:
- Temperature Range: -25°C to +150°C
- Stability: ±0.01°C
- Cooling Capacity: 500 Watts at 20°C
- Pumping Capacity: 15 Lpm
- Bath Volume: 7 Liters
- Unit Dimensions (HxWxD): 23.625" x 9.25" x 17.5"
Pump - Peristaltic
Dynamax
Model RP-1*Ideal for critical liquid chromatography, gradient generation, and flow analyzer applications.*
Specifications:
- Head speed: 0 to 48 rpm
- Torque: Greater than 3 N-m across full operating range at 115VAC
- Speed stability: 0.5%
- Speed adjustment: 0.00 to 9.99 rpm in 0.01 rpm increments
10.0 to 48.0 rpm in 0.1 rpm increments- Flow rate: 0-37 mL/min max at 0 backpressure (depending on tubing diameter)
- Max back-pressure: 70 psi
- Wetted surfaces: PVC, Silicon, Viton (tubing only)
- Flow tubing diameter: 0.25 mm ID - 4 mm ID
- Temperature: 4° to 40°C
- Humidity: Up to 95% non-condensing
- Operating position: Vertical ±5°
Table - Vibration Isolation
AVI-400Specifications:
- Isolation: Dynamic 1 Hz to 200 Hz - Passive beyond 200 HZ
- Transmissibility: Above 10 Hz transmissibility <0.01 (-35dB)
- Static Compliance: 6.13 x 10-4in/lb vertical, 1.23 x 10-3 in/lb horizontal
- System Noise: Less than 50nG/Hz from 0.1-200 HZ in any direction
- Maximum Load: 6400 lbs (800 lbs per module, 8 modules max)
- Size: 28.3 x 17.5 x 4.5 (inches) or 13.8 x 7.5 x 4.5 (inches)
Trough - Langmuir
KSV Langmuir-Blodgett MinitroughFilm Deposition System:
- Control and operation: Software controlled unsupervised and automatic film depositions.
- Deposition speed: Standard range 0.1 to 100 mm/min. Speed adjustment increment 0.1 mm.
- Length of deposition arm stroke: 60 mm.
- Deposition cycles: 1 to unlimited depositions. Number of consecutive depositions dependent of substrate and trough film area.
- Dwell times: 0 s to max. 9999 s, individual adjustment for upper and lower endpoint substrate movement.
- Max. size of substrate: 60 x 30 mm (100% immersion).
- Type of deposition motor: Servo controlled DC motor.
Film Pressure Measuring System:
- Measuring principle: Wilhelmy plate, platinum or paper sensor element connected to microelectronic feedback system for surface pressure control. Software controlled operation, user programmable process parameters.
- Film balance measuring range: 0 to 125 mN/m.
- Resolution: 4 µN/m.
- Surface area regulation: Symmetric compression of monolayer by inwardly moving barrier. Software controlled operation and user programmable process parameters.
- Surface barrier: Made of hydrophilic, optionally hydrophobic, material.
- Compression speed: 0.02 mm to 200 mm/min.
- Inaccuracy: Less than 1%.
- Barrier drive: Servo controlled DC motor.
Trough:
- Material: Solid, non porous cast-moulded PTFE. No glue or o-ring seals. Aluminium base plate with built-in water channels for temperature control of the subphase. PTFE thickness at trough bottom 1.15 mm.
- Size: 260 x 75 x 5 mm.
Microscope
Nikon Eclipse E600POLPlease see this pdf file for specifications.
Microscope Camera
Diagnostic Instruments Spot RT KE SliderPlease see this pdf file for specifications.
X-Ray - Reflectivity
The NCNR x-ray diffractometer is configured to allow both θ/2θ diffraction and reflectometry. Typically Cu radiation is used with minimum resolution of Δλ=0.004Å and Δθ=0.0003 radians or ΔQ=0.0025Å-1. Reflectivities as low as ~10-8 have been measured. There is direct computer control using the standard ICP program. The five motions that are controlled are θ, 2θ, sample translation along an axis located 90°+θ from the incident beam, sample tilt about an axis perpendicular to the translation (all in the scattering plane), and an automated attenuator changer.
*NOTE* Use of the instrument is restricted to NCNR staff, however, outside users can gain access to the x-ray diffractometer through their instrument contact or NCNR staff collaborator. This x-ray instrument is self-scheduled, via a sign up calendar located at the instrument.
Please contact Sushil Satija (301-975-5250, sushil.satija@nist.gov) for more information.
X-Ray - Residual Stress
Residual Stress X-ray InstrumentThe diffractometer is part of the Residual Stress Program with the main purpose of measuring strains/stresses. Other possible applications are the measurement of preferred orientation, and, with restrictions, single crystal or powder measurements.
Specifications:
- Huber 512.5 Split Eulerian Cradle with XYZ-table
- Table range: x,y +/- 75 mm, z : 0..25 mm
- Ordela 1050X position sensitive X-ray detector
- X-ray tubes: Molybdenum,Copper,Cobalt,Chromium
- Collimation: pinhole collimators for primary beam
- Control Software: SPEC by Certified Scientific Software
- Analysis software : PF (in-house for graphical peak analysis, fitting, stress calculation and so on)
Please contact Thomas Gnäupel-Herold (301-975-5380, thomas.gnaeupel-herold@nist.gov) for more information.
