Technical Activities
Search Our Publications Database
EEEL Offices
Office of Microelectronics Programs
Office of Law Enforcement Standards
EEEL Projects
Semiconductor Electronics Division (812)
- Nano-Structures for CD and Interconnect Metrology
- Metrology for System-on-a-Chip
- Power Device and Thermal Metrology
- Micro-Nano-Technology (MNT)
- Nanobiotechnology
- Wire Bonding to Cu/Low-k Semiconductor Devices
CMOS and Novel Devices (812.06)
- Advanced MOS Device Reliability and Characterization
- Macro Electronics
- Nanoelectronic Device Metrology
- Theoretical Solid-State Physics for Semiconductors
-
Electronic Information (812.07)
- Infrastructure for Integrated Electronics Design and Manufacturing
Enabling Devices and ICs (812.05)
Optoelectronics Division (815)
- Laser Radiometry
- High Speed Measurements
- Display Metrology
Optical Fiber and Components (815.03)
- Interferometry and Polarimetry
- Spectral and Nonlinear Properties
Optoelectronics Manufacturing (815.04)
- Optical Materials Metrology
- Nanostructure Fabrication and Metrology
- Semiconductor Growth and Devices
Sources, Detectors and Displays (815.01)
Quantum Electrical Metrology Division (817)
- Voltage Metrology
- Metrology of the Ohm
- Electronic Kilogram
- Single Electron Tunneling (SET)
- AC-DC Difference Standards and Measurement Techniques
Applied Electrical Metrology (817.02)
- Farad and Impedance Metrology
- Pulse Metrology and Time Domain Measurements
- Electric Power Metrology
Quantum Devices (817.03)
- Nanoscale Cryoelectronics
- Quantum Voltage
- Quantum Sensors
- Quantum Information and Terahertz Technology
- Magnetic Sensors
Fundamental Electrical Metrology (817.01)
Electromagnetics Division (818)
- Microwave Measurement Services
- Micro/Nano Electronics
- Electromagnetic Properties of Materials
-
Radio-Frequency Fields (818.02)
- Antenna Theory and Applications
- Antenna Near-Field Measurements
- Metrology for Radar Cross Section Systems
- Reference Fields and Probes
- Complex Fields
- Metrology for Wireless Systems
- Time-Domain Fields
-
Magnetics (818.03)
- Magnetic Devices and Nanostructures
- Magnetodynamics
- Microsystems for Bioimaging and Metrology
- Spin Electronics
- Standards for Superconductor and Magnetic Measurements
- Magneto-Mechanical Measurements for High Current Applications
Radio-Frequency Electronics (818.01)