Technical Activities

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EEEL Offices

Office of Microelectronics Programs

Office of Law Enforcement Standards

EEEL Projects

Semiconductor Electronics Division (812)

Enabling Devices and ICs (812.05)

• Nano-Structures for CD and Interconnect Metrology
• Metrology for System-on-a-Chip
• Power Device and Thermal Metrology
• Micro-Nano-Technology (MNT)
• Nanobiotechnology
• Wire Bonding to Cu/Low-k Semiconductor Devices

  CMOS and Novel Devices (812.06)

• Advanced MOS Device Reliability and Characterization
• Macro Electronics
• Nanoelectronic Device Metrology
• Theoretical Solid-State Physics for Semiconductors

• Electronic Information (812.07)

• Infrastructure for Integrated Electronics Design and Manufacturing

Optoelectronics Division (815)

Sources, Detectors and Displays (815.01)

• Laser Radiometry
• High Speed Measurements
• Display Metrology

  Optical Fiber and Components (815.03)

• Interferometry and Polarimetry
• Spectral and Nonlinear Properties

  Optoelectronics Manufacturing (815.04)

• Optical Materials Metrology
• Nanostructure Fabrication and Metrology
• Semiconductor Growth and Devices

Quantum Electrical Metrology Division (817)

Fundamental Electrical Metrology (817.01)

• Voltage Metrology
• Metrology of the Ohm
• Electronic Kilogram
• Single Electron Tunneling (SET)
• AC-DC Difference Standards and Measurement Techniques

  Applied Electrical Metrology (817.02)

• Farad and Impedance Metrology
• Pulse Metrology and Time Domain Measurements
• Electric Power Metrology

  Quantum Devices (817.03)

• Nanoscale Cryoelectronics
• Quantum Voltage
• Quantum Sensors
• Quantum Information and Terahertz Technology
• Magnetic Sensors

Electromagnetics Division (818)

Radio-Frequency Electronics (818.01)

• Microwave Measurement Services
• Micro/Nano Electronics
• Electromagnetic Properties of Materials

• Radio-Frequency Fields (818.02)

• Antenna Theory and Applications
• Antenna Near-Field Measurements
• Metrology for Radar Cross Section Systems
• Reference Fields and Probes
• Complex Fields
• Metrology for Wireless Systems
• Time-Domain Fields

• Magnetics (818.03)

• Magnetic Devices and Nanostructures
• Magnetodynamics
• Microsystems for Bioimaging and Metrology
• Spin Electronics
• Standards for Superconductor and Magnetic Measurements
• Magneto-Mechanical Measurements for High Current Applications

100 Bureau Drive, M/S 8100
Gaithersburg, MD 20899-8110
301-975-2220 Telephone
301-975-4091 Facsimile

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Date created: 7/6/2005
Last updated: 8/13/2007