8-ID-E is primarily devoted to grazing incidence x-ray scattering (GIXS) measurements of the structure and processing kinetics of organic thin films. Measurements are made in both the wide-angle geometry (GIWAXS) (sensitive to molecular packing) and small-angle geometry (GISAXS) (sensitive to mesoscale ordering). A high-speed version of the Pilatus 1M detector provides wide-angle time-resolved (> 10 ms) data collection. A variety of sample environments are available for in situ measurements of films. Recent research at 8-ID-E is focused on correlating the structure of organic electronic thin films with performance parameters and probing defects in self-assembled block copolymers with applications to nanolithography.

8-ID-E also hosts a wide angle x-ray photon correlation spectroscopy program (WA-XPCS) that examines very low energy fluctuations in hard condensed matter. It is well suited for studies of metallic glasses, thin films, and novel materials such as complex oxides. A new high-speed Pixel Array Detector samples these fluctuations up to 2000 Hz.

beamline specifications

8-ID-I hosts the small angle XPCS program that examines very low energy fluctuations in hierarchically ordered soft materials such as polymer nanocomposites and glassy colloidal suspensions. Temperature and sample composition are traditional independent variables but considerable flexibility is provided for user-supplied sample environments such as rheometers, strain cells and deposition chambers. High-gain, high-resolution increasingly fast area detectors are used for measuring the time series of speckle patterns. An efficient and user-friendly interface to APS high-performance computing (HPC) resources provides rapid data reduction. Work in this station is relevant to understanding the stability of novel forms of matter with ultimate application to the food and consumer products industries. 

beamline specifications