April-June 2014

April-June 2014 Issue
Highlights
A program to ensure IDC officers are optimally qualified and prepared for the challenges of command
By Deputy Chief of Naval Operations for Information Dominance (OPNAV N2/N6)
Best value, best pricing, best terms and conditions for the software you need
By DoD ESI/DON Enterprise Licensing Agreements Team
By Steve Daughety
A user-friendly way to find the information you need
By Sharon Anderson
By Heather Rutherford with Robert Freeman, N6E6C
By Heather Rutherford with NAVAIR
By Jim Garamone, American Forces Press Service
Migration will save about $20 million per month
By Sharon Anderson, CHIPS Senior Editor
Empowering Enterprise IT
By Mukesh Barot
Q&A
Department of the Navy Assistant for Administration (DON/AA) Talks About the DON Tasking, Records and Consolidated Knowledge Repository
By CHIPS Magazine
Commander, Naval Network Warfare Command and Commanding Officer, Navy Cyber Defense Operations Command Talk Cybersecurity and the Insider Threat
By CHIPS Magazine
Lead Machinery Control System Engineer for U.S. Coast Guard Polar Class Icebreaker
By CHIPS Magazine
IT Specialist, Navy DoD Supercomputing Resource Center Discusses High Performance Computing Upgrades for the Navy and DoD
By CHIPS Magazine
Features
An Overview
By Jennifer M. Ellett and Shaun Khalfan
By Capt. Elizabeth Thomas and Cmdr. Stacey Prescott
Lessons Learned from an N6/Assistant Chief of Staff for C4I
By Cmdr. Jason A. Parish
By U.S. Coast Guard News
By Vice Adm. Phil Cullom, Deputy Chief of Naval Operations for Fleet Readiness and Logistics
Facility to house the Navy’s program for new and emergent electromagnetic sensors
By David Sanders, NUWC Public Affairs Office
By Mass Communication Specialist 1st Class Jason T. Poplin
CHIPS is an official U.S. Navy website sponsored by the Department of the Navy (DON) Chief Information Officer, the Department of Defense Enterprise Software Initiative (ESI) and the DON's ESI Software Product Manager Team at Space and Naval Warfare Systems Center Pacific.

Online ISSN 2154-1779; Print ISSN 1047-9988