The Integrated Circuit Testing Facility is a state-of-the-art
laboratory fully equipped to provide the full spectrum of equipment for rapid prototype
development, testing and characterization. For troubleshooting and debugging, we
have laser device isolation capability, scanning electron and field emission microscopes,
and a focused ion beam milling machine.
Reverse Engineering
Available documentation related to the original device is thoroughly reviewed. If
no documentation for an integrated circuit exists, we take it apart to learn enough
about it so that we can reproduce it.
Characterization The integrated circuit is tested electronically to identify its operational characteristics
and these are compared with the existing (or derived) documentation for the device.
When the device simulation models and the electrical test parameters match, characterization
is complete and a design based on a new process can go to fabrication.
Design and Validation
Modern computer-aided design (CAD) tools are used to design a replacement device.
All newly designed integrated circuits are tested on automatic test equipment (ATE).
DMEA can qualify devices to their original design specification.
DMEA has the capability to test:
Wafers up to 8 inch diameter over full military temperature range
Single die
Radio frequency (RF) to V-band, including noise parameters,
power spectral density, and S-parameters
“Please accept my appreciation for
the outstanding support that you provide to the warfighter. By ensuring expedient
delivery of [your] team to Aviano AB, Italy, you ensured that our pilots had the
finest technology available to rehearse their combat missions. This capability is
vital to the warfighter-and your efforts made it happen.”
