NIST Microwave Uncertainty Framework (Beta version)The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of uncertainties in VNA and other measurements. The framework makes it easy to construct models for calibration standards and automates the calculation of uncertainties with both a conventional linear error-propagation analysis and a Monte-Carlo analysis capable of propagating uncertainties through nonlinear models. The framework includes a Vector-Network-Analyzer (VNA) Uncertainty Calculator for guiding the generation of uncertainties in scattering parameters. The framework also includes a post processor that allows the uncertainties in measured scattering parameters to be propagated to derived measurements, such as transistor gain, power, material parameters, and mismatch-corrected temporal signals. StatistiCAL VNA Calibration Software PackageThe StatistiCALTM VNA Calibration Software Package is our newest VNA calibration software package. It accommodates almost all coaxial and on-wafer standards, and enables a "mix and match" philosophy to VNA calibration. The software is based on an algorithm developed at the U.S. National Institute of Standards and Technology (NIST) and the Physikalisch-Technische Bundesanstalt (PTB) of Germany, which is able to estimate the uncertainty of its own results due to random errors. The algorithm features a high degree of robustness, allowing it to find solutions even with poor initial estimates. The software combines a decade of experience in statistics and orthogonal distance regression with an easy-to-use user interface. Research at NIST has extended the analysis of uncertainties caused by random errors to include systematic errors in the solution. The uncertainties in the solution are represented by a covariance matrix that relates errors in both the VNA calibration and measurements of the device under test. In addition, the algorithm determines coverage factors based on the different numbers of degrees of freedom associated with various parts of the solution. Read a paper describing the algorithms employed by this new software package. Read a paper comparing this algorithm to MultiCal. To receive a free copy of the software, download the installation file, read the user agreement, and request a password. Please include the statement "I have read and agree to the terms and conditions of the NIST Measurement Software user agreement" in your e-mail. MultiCalMultiCalTM was developed by the NIST/Industrial Measurement Consortium. On-wafer measurement software implementing the multiline TRL calibration, LRM with imperfect standards, off-wafer CPW calibrations, calibrations for lossy lines, and the calibration comparison method for accuracy assessment. Download the user's manual. The HTBasic*interpreter runs under DOS*, Win3.1*, Win95*, and some other operating systems. Click here to download an older demo version of HTBasic.* Read the user agreement. Request a password. Please include the statement "I have read and agree to the terms and conditions of the NIST Measurement Software user agreement" in your e-mail. NISTCal Four-Port Measurement SoftwareNISTCal was developed by the NIST/Industrial Measurement Consortium. This software performs most of the most-used functions of MultiCal® in a four-port measurement environment. It supports multi-line TRL calibrations with impedance correction, LRM calibrations with imperfect standards, and calibrations for lossy lines. It is capable of performing orthogonal two-port, three-port, and four-port measurements with in-line on-wafer calibrations and the addition of some inexpensive hardware. Read the user agreement. Request a password. Please include the statement "I have read and agree to the terms and conditions of the NIST Measurement Software user agreement" in your e-mail. Download the MultiCal user's manual, useful for understanding the functions implemented in NISTCal. Download a paper describing the 4-port hardware and algorithm. LSNA Verification SoftwareThe NIST LSNA Verfication Software uses a procedure similar to the calibration comparison method to help a user evaluate the differences between LSNA calibrations. The user performs two calibrations that may differ due to standards used, test set drift, or other reasons. The software program compares the two calibrations and helps the user asses the impact of the differences between them. Read a paper about the method.
Characteristic Impedance of Silicon Transmission LinesSoftware designed to accurately determining the characteristic impedance of transmission lines fabricated on silicon substrates. The Characteristic Impedance of Silicon Transmission Lines Software was developed by the NIST/Industrial Measurement Consortium and is only available to Consortium members until May 1999. Read the user agreement. Request a password. Please include the statement "I have read and agree to the terms and conditions of the NIST Measurement Software user agreement" in your e-mail. Download a paper comparing this algorithm to other methods. CausalCat: Computation of |Z0| from arg(P0)Software for computing causal characteristic-impedance magnitude from the phase of the integral of the Poynting vector over the guide cross section. The resulting characteristic impedance satisfies the requirements of a new causal power-normalized circuit theory. Read the user agreement. Request a password. Please include the statement "I have read and agree to the terms and conditions of the NIST Measurement Software user agreement" in your e-mail. Download preprint of a paper describing the algorithm. Read the story of the Causal Cat.
Software for correcting for jitter, drift, and time-base distortion in your oscilloscope. |
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High Speed Measurement On-Wafer Measurement Metrology
Metrology for Electronic Packaging
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