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Welcome
The Radio-Frequency Electronics Group conducts theoretical and experimental research to develop basic metrology, special measurement techniques, and measurement standards necessary for advancing both conventional and microcircuit guided-wave technologies; for characterizing active and passive devices and networks; and for providing measurement services for scattering parameters, power, waveform, noise, material properties, and other basic quantities. Programs/Projects
High Speed Electronics—This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of high-frequency microwave metrology for … Thermal Noise Metrology—This project develops methods for very accurate measurements of thermal noise and provides support for such measurements in the communications and electronics industries and in other government … Advanced Materials Metrology—In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the interaction of microwaves with materials and the … Fundamental Guided Wave Metrology—Radio-frequency (RF) waves and microwaves are involved with almost every facet of everyday life. Radio stations, television, wireless devices, satellite services, weather radar, and many more use … Advanced High Frequency Devices—The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at high frequencies. Relevant high-frequency devices … |
Contact
Ronald Ginley 325 Broadway |