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Hitachi HD2700C Scanning Transmission Electron MicroscopeThe Hitachi 2700C is a dedicated Scanning Transmission Electron Microscope (STEM), operating at 80, 120 and 200 kV. It has a probe aberration-corrector, which improves imaging spatial resolution to less than 1Å. The energy resolution for electron energy loss spectroscopy (EELS) can be as small as 0.35 eV, due to its cold field emission electron gun (FEG) and the presence of a high-resolution parallel EELS detector (Gatan Enfina-ER). This instrument is ideal for probing structural and electronic properties of materials at the Angstrom level, allowing on to study the physical, chemical and electronic structure of oxide interfaces, catalysts and other functional nanomaterials. Notably, this Hitachi STEM has a secondary electron microscopy (SEM) detector for high resolution SEM imaging of the particles on the surface, with atomic resolution imaging have been demonstrated in the SEM imaging mode. For instrument schedule and requirements: contact Dong Su (dsu@bnl.gov). Specifications
Detectors
Resolution
References(1) H. Inada, L. Wu, J. Wall, D. Su, and Y. Zhu, J. Electron
Microscopy, 58 (2009) 111 Example Images & SpectraHigh-angle annular dark field imaging: (a) and (b) High angle annular dark field (HAADF) images on SrTiO3/Si interface. (c) The structure model from a b initio calculation confirmed the atomic structure at the interface showing in (a) and (b). EELS at high spatial resolution: EELS is a powerful technique to probe the local compositional and electronic information. Here is an example of EELS-2D mapping on Li-battery electrode materials as how Li and Fe elements distributed at nanometer scale. SEM imaging:
Last Modified: January 10, 2011 |