|
U3C
|
Metrology
| 50-1000 eV |
Kenneth Moy
|
|
U7A
|
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
X-ray photoelectron spectroscopy
| 180-1200 eV |
Daniel Fischer
|
|
U8B
|
Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 100-1000 eV |
Daniel Fischer
|
|
U11
|
Ultra violet circular dichroism
| 3-10 eV |
Steven Hulbert
|
|
U12A
|
X-ray absorption spectroscopy
X-ray photoelectron spectroscopy
| 100-800 eV |
David Mullins
|
|
U13UB
|
Ultraviolet photoelectron spectroscopy
Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
| 3-30 eV |
Peter Johnson
|
|
X1A1
|
X-ray photoelectron spectroscopy
| .25-.80 keV |
George Flynn
|
|
X1A2
|
X-ray scattering, resonant
| .25-800 keV |
John Hill
|
|
X1B
|
X-ray absorption spectroscopy
X-ray fluorescence spectroscopy
X-ray photoelectron spectroscopy
| .2-1.6 keV |
Peter Abbamonte
|
|
X3A
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
| 4.6-15.1 keV |
Mark Chance
|
|
X3B
|
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
| 3.8-13.5 keV (4.8 - 13 standard) |
Mark Chance
|
|
X4A
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
| 3.5-20 keV |
Wayne Hendrickson
|
|
X4C
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
| 7-20 keV |
Wayne Hendrickson
|
|
X7B
|
X-ray diffraction, single crystal
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, wide angle
| 25-50KeV |
Jose Rodriguez
|
|
X8A
|
Metrology
| 1.0-5.9 keV |
Kenneth Moy
|
|
X11A
|
X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 4.5-40 keV |
William O'Grady
|
|
X11B
|
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, near edge structure
| 5.0-23 keV |
William O'Grady
|
|
X15B
|
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 1.2-8 keV, standard 2-5 |
Paul Northrup
|
|
X16C
|
X-ray diffraction, powder
| 6.5-25 keV |
Peter Stephens
|
|
X19C
|
X-ray topography
| 6-40 keV |
Michael Dudley
|
|
X20A
|
X-ray diffraction, single crystal
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
| 4.5-13 keV |
Jean Jordan-Sweet
|
|
X20C
|
X-ray diffraction, time resolved
| 7-11 keV (Si(111));4-11 keV (multilayers) |
Jean Jordan-Sweet
|
|
X22B
|
X-ray scattering, liquid
| 8 keV (fixed energy) |
John Hill
|
|
X22C
|
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray reflectivity
X-ray scattering, resonant
| 3-12 keV |
John Hill
|
|
X23A2
|
X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 4.7-30 keV |
Joseph Woicik
|
|
X24A
|
X-ray diffraction, standing waves
Auger spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray photoelectron spectroscopy
| 1.8-6 keV |
Daniel Fischer
|
|
X26A
|
InSynC - Education
Microdiffraction Imaging
X-ray microprobe
| 3-30 keV |
Stephen Sutton
|
|
X27B
|
High aspect ratio microsystems technology
| 8 - 40 keV |
Ralph James
|
|
X27C
|
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, small angle
X-ray scattering, wide angle
| 9 KeV |
Tadanori Koga
|
|
X28C
|
X-ray Footprinting
| Focused White Beam |
Mark Chance
|
