Philips CM200-FEG TEM-STEM
Techniques/Capabilities
- 200-kV Schottky field-emission gun (FEG)
- Post-column Gatan imaging filter (GIF) for EFTEM and EELS
- EDAX R-TEM Si(Li) X-ray spectrometer
- Fischione HAADF (Z-contrast) and Gatan BF/DF STEM detectors
- CompuStage SuperTwin lens (±30° tilt)
- Gatan Digiscan acqisition system for integrated STEM, EFTEM, EDS, and EELS
- Specimen holders: double-tilt EDS (RT and LN2 cooling), wide range of pre-CompuStage holders
Current Research Activities
- High-resolution (~1 nm) EDS and EELS microanalysis in STEM mode
- Conventional TEM, diffraction, and energy-filtered TEM
Contact:
Chad Parish, parishcm@ornl.gov(865) 574-0092