Scanning/Transmission Electron Microscopes

• Nion UltraSTEM 60-100 dedicated aberration-corrected STEM for low- to mid-voltage operation and Enfina EELS
  Contact: Juan-Carlos Idrobo, idrobojc@ornl.gov
• FEI Titan S 80-300 TEM/STEM with CEOS probe-corrector and EELS/GIF
  Contact: Miaofang Chi, chim@ornl.gov
• Hitachi HF3300 FEG-TEM/STEM with EDS and EELS/GIF
  Contact: Karren More, morekl1@ornl.gov
• FEI/Philips CM200 FEG-TEM/STEM with EDS, EELS/EF-TEM
  Contact: Chad Parish, parishcm@ornl.gov

Research Highlights

• Study of the Microstructure of Doped Clathrate and Skutterudite Thermoelectric Materials
• Mapping the Location of Electrons and Holes in Layered Ca₂Nb₃O₁₀ Potocatalyst
• Z-STEM Imaging of Chemical Ordering in FePt Magnetic Nanoparticles
• See all highlights....

This web site provides a complete listing of all the ShaRE resources (proposal forms, staff/contact information, instruments/capabilities, etc.) necessary to access the ShaRE User Facility at ORNL.

Important Links

• ORNL
• MST Division
• Microscopy Group
• DOE Office of Science
• DOE Office of Basic Energy Sciences
• BES Division of Scientific User Facilities
• Instrument Reservation System(Internal Only)