NIST
[skip navigation]National Institute of Standards and TechnologyNational Institute of Standards and Technology - TimeNational Institute of Standards and Technology - Home PageNational Institute of Standards and Technology - About NISTNational Institute of Standards and Technology - Contact UsNational Institute of Standards and Technology - A-Z Site IndexNIST Physical Measurement LaboratoryPML Semiconductor & Dimensional Metrology DivisionSDMD Dimensional Metrology GroupSDMD Surface & Nanostructure Metrology GroupSDMD Nanoscale Metrology GroupSDMD Microelectronics Device Integration GroupSDMD CMOS Reliability & Advanced Devices Group
  ENGINEERING METROLOGY TOOLBOX  
HomeRefractive Index of AirElasticPublications
 Selected Publications 

Selected Publications is a web-based collection of publications about dimensional metrology.
Download Free Acrobat Reader
PDF Icon

On Characterizing Master Involute Profiles; NBSIR 73-272; 1973


Erber, E.; Norden, B.

NBS Internal Report 73-272; 29p. August 28, 1973.

Keywords:
Calibration; gear; involute.

Abstract:
The involute profile plays an important role in gear metrology. It is necessary to quantify that profile on involute masters so that an accurate for gear teeth may be transferred from the master profile. The procedures for calibration of a master involute profile on a two coordinate axis measuring machine is the function of this paper.

Return to Top of Document

Web Site Home: Engineering Metrology Toolbox
Technical Inquiries: Ted Doiron, Group Leader
Dimensional Metrology
Semiconductor and Dimensional Metrology Division
Physical Measurement Laboratory
NIST, 100 Bureau Drive, Stop 8211, Gaithersburg, MD 20899-8211

The National Institute of Standards and Technology (NIST) is an agency of the U.S. Department of Commerce.
NIST / PML / Semiconductor and Dimensional Metrology Division

NIST Program Questions: Public Inquires Unit
(301) 975-NIST (6478) TTY (301) 975-8295
NIST, 100 Bureau Drive, Stop 3460, Gaithersburg, MD 20899-3460

Privacy Policy / Security Notice / Accessibility Statement / Disclaimer / Freedom of Information Act (FOIA) / 
Environmental Policy Statement / No Fear Act Policy / ExpectMore.gov (performance of federal programs) / 
NIST Information Quality Standards / Scientific Integrity Summary

Date Created: Friday, October 18, 2002
Last Updated: Wednesday, December 28, 2011
Technical Web Site Questions: Jay Zimmerman
Feedback and Comments: Webmaster