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A Random Effect Approach to Protection Against Model Error in Logistic Models of Census Coverage

Donald J. Malec, Julie H. Tsay, Elizabeth T. Huang

 

 

CITATION:

Donald J. Malec, Julie H. Tsay, Elizabeth T. Huang. (2011). A Random Effect Approach to Protection Against Model Error in Logistic Models of Census Coverage. Center for Statistical Research & Methodology, Research and Methodology Directorate Research Report Series (Statistics #2011-01). U.S. Census Bureau. Available online at <http://www.census.gov/srd/papers/pdf/rrs2011-01.pdf>.

Source: U.S. Census Bureau, Center for Statistical Research & Methodology, Research and Methodology Directorate

Published online: March 17, 2011
Last revised: March 17, 2011

 


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Source: U.S. Census Bureau | Center for Statistical Research & Methodology | (301) 763-3215 (or chad.eric.russell@census.gov) |   Last Revised: November 17, 2011