MAGIK Offspecular Reflectometer

For studies of thin-film samples with in-plane structure

The MAGIK reflectometer complements the Polarized Beam Reflectometer and the Horizontal-Geometry Reflectometer in providing specialized capabilities for measurements of in-plane scattering in addition to world-class depth-profiling (with specular reflectivity) of biological, battery/electrochemical, polymer, and magnetic thin films.

Polarized-beam measurements are possible with the use of a ³He analyzer.

This instrument is an evolution of the AND/R reflectometer, which was located on the NG-1 guide. MAGIK is located along the NG-D guide in the expanded guide hall (part of the NCNR's Expansion Initiative).

The Reflectometer

• Description and characteristics of AND/R
• Reflectivity Formalism
• Instrument Schedule
• Obtaining Beamtime

Research

• MAGIK and AND/R Publications
• Biology

Data Analysis

• Overview
• Download ReflPak
• SLD Calculator

Interactive online scattering demos

(requires Chrome, Firefox, Safari or IE9+)

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Support

Refrigerators, furnaces, magnets, liquid cells, and lasers are available for control of sample environment. On-site x-ray reflectometry is available for additional sample characterization. If you're interested in performing an experiment, apply for beamtime, or contact one of the instrument scientists directly. Monetary assistance may be available for new facility users.

accessible within NIST only: MAGIK development blog

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Instrument Scientists

• B.B. Maranville, (301) 975-6034, brian.maranville@nist.gov

• J.A. Dura, (301) 975-6251, jdura@nist.gov

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