Material Details

SRM 1994 - Standard Silicon Single Crystal Wafer for Crystalline Orientation

crystal orientation, silicon wafer, X-ray diffraction, XRD

- Certificate    - MSDS    - Table

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•   Certificate
•   Material Safety Data Sheet (MSDS)
•   Related Materials: 209.1 - X-Ray Diffraction (powder and solid forms)

Details
Description:	Standard Silicon Single Crystal Wafer for Crystalline Orientation
Lot:	N/A
Expiration Date:
Unit Price*:	$2,142.00
Unit of Issue:	100-mm wafer
Status:	Now Selling
Certificate Date:	2/6/2007
MSDS Date:	4/30/2012
Technical Contact:	Eric Benck
Additional Information:	N/A

Shipping Information
Perishable:	No
Hazardous Material:	No
Material Hazard Class:	N/A

Measurand Data
- Certified values are normal font - Reference values are italicized - Values in parentheses are for information only The certificate is the only official source for values and uncertainties.
209.1 - X-Ray Diffraction (powder and solid forms)  Additional Information >>
	Parameter	Value
	XRD Application	Crystalline Orientation

^*Prices are subject to change without notice

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Date created: 3/10/2002

Last updated: 8/8/2012