Jeonghoon Ha

Jeonghoon Ha is a CNST/UMD Postdoctoral Researcher in the Electron Physics Group.  He received a B.S. in Mathematics and Physics and a Ph.D. in Physics from Seoul National University.  His doctoral research at Seoul National University focused on measuring the electronic structure of graphene using scanning tunneling microscopy techniques.  At the CNST, Jeonghoon is working with Joseph Stroscio as part of a collaboration with Professor Young Kuk at Seoul National University to measure the properties of graphene using spin polarized scanning tunneling microscopy. 

• Enhanced carrier transport along edges of graphene devices, J. Chae, S. Jung, S. Woo, H. Baek, J. Ha, Y. J. Song, Y.-W. Son, N. B. Zhitenev, J. A. Stroscio, and Y. Kuk, Nano Letters 12, 1839-1844 (2012).
  NIST Publication Database        Journal Web Site
  
  
• Graphene: Materials to devices (invited), J. Chae, J. Ha, H. Baek, Y. Kuk, S. Jung, Y. Song, N. Zhitenev, J. Stroscio, S. Woo, and Y. Son, Microelectronic Engineering 88, 1211-1213 (2011).
  NIST Publication Database        Journal Web Site
  
  
• Charge puddles and edge effect in a graphene device as studied by a scanning gate microscope, J. Chae, H. J. Yang, H. Baek, J. Ha, Y. Kuk, S. Y. Jung, Y. J. Song, N. B. Zhitenev, J. A. Stroscio, S. J. Woo, and Y. Son, International Journal of High Speed Electronics and Systems 20, 205 (2011).
  NIST Publication Database        Journal Web Site