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Topic Area: Advanced Materials

Displaying records 1 to 10 of 25 records.
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1. Fluid interactions with metafilm/metasurfaces for tuning, sensing, and microwave assisted chemical processes
Topic: Advanced Materials
Published: 5/25/2011
Authors: Joshua A Gordon, Christopher L Holloway, James C Booth, James R. Baker-Jarvis, David R Novotny, Sung Kim, Yu Wang
Abstract: In this paper we demonstrate tunability of a metafilm, which is the two-dimensional equivalent of a metamaterial, also referred to as a metasurface, by changing the permittivity in a micro-fluidic channel that interacts with the metafilm. Numerical s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907703

2. Investigation of SiO2/HfO2 stacks for flash memory applications
Topic: Advanced Materials
Published: 4/28/2011
Authors: Nhan V Nguyen, Bashwar Chakrabarti
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908443

3. Flip Chip Lamination to electrically contact organic single crystals on flexible substrates
Topic: Advanced Materials
Published: 4/20/2011
Authors: Oana Jurchescu, Brad Conrad, Christina Ann Hacker, David J Gundlach, Curt A Richter
Abstract: The fabrication of top metal contacts for organic electronics represents a challenge and has important consequences for electrical properties of such systems. We report a low cost and non-destructive printing process, Flip Chip Lamination (FCL), to f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907524

4. Methods of characterization of broadband dielectric properties, challenges in device fabrication and measurement
Topic: Advanced Materials
Published: 6/1/2010
Authors: James C Booth, Nathan D. (Nathan) Orloff
Abstract: We present a new experimental method for determining the broadband dielectric permittivity of ferroelectric thin film samples over the broad frequency range 100 Hz - 40 GHz. Such characterization is extremely important for both a fundamental unders ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33022

5. Microstructural Evolution of Pd-doped Nanoscale Zero-valent Iron (nZVI) Particles in Aqueous Media and Implications for Particle Reactivity
Topic: Advanced Materials
Published: 5/6/2010
Authors: Andrew A Herzing, Weile Yan, Christopher J. Kiely, Wei-xian Zhang
Abstract: Palladized zero-valent iron nanoparticles have been frequently employed to achieve enhanced treatment of halogenated organic compounds. However no detailed study has been published on their structures, especially the distribution of palladium within ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904152

6. Challenges and Opportunities of Organic Electronics
Topic: Advanced Materials
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

7. Multiwalled carbon nanotubes coated with silicon carbonitride (SiCN)
Topic: Advanced Materials
Published: 4/1/2010
Authors: Katie Hurst, Christopher L Cromer, Elisabeth Mansfield, Roop Mahajan, John H Lehman, Gurpreet Singh
Abstract: We describe the development of two next-generation optical coatings; amorphous polymer-derived silicon carbonitride (SiCN) particles and a composite consisting of SiCN surrounding a multiwalled carbon nanotube (MWCNT) core. Laser-induced damage testi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904161

8. Organic Electronics: Challenges and Opportunities
Topic: Advanced Materials
Published: 3/31/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905389

9. High performance airbrushed organic thin film transistors
Topic: Advanced Materials
Published: 3/30/2010
Authors: Calvin Chan, Lee J Richter, Brad Anthony Dinardo, Cherno Jaye, Brad Conrad, Hyun Wook Ro, David Germack, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904576

10. Electrical and structural characterization of high performance airbrushed organic thin film transistors
Topic: Advanced Materials
Published: 3/18/2010
Authors: Calvin Chan, Lee J Richter, Cherno Jaye, Brad Conrad, Hyun Wook Ro, David Germack, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905344



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