About the Semiconductor and Dimensional Metrology DivisionThe Semiconductor and Dimensional Metrology Division (SDMD) combines the efforts of the former Semiconductor Electronics Division (formed in 1955) and the former Mechanical Metrology Division (formed in 2010). The Division, with a staff of about 140 including full-time and part-time employees as well as guest researchers, post-doctoral associates, and contractors, is based in Gaithersburg, Maryland. The Division operates within the Physical Measurements Laboratory at NIST. The Division's technical activities are organized into five groups: the Dimensional Metrology Group, the Surface and Nanostructure Metrology Group, the Nanoscale Metrology Group, the Microelectronics Device Integration Group and the CMOS Reliability and Advanced Devices Group. The Division also supports the Center for Nanoelectronics Devices Reliability. The Division, in cooperation with the National Research Council (NRC), offers competitive awards for post-doctoral research for U.S. citizens in a variety of technical fields related to the semiconductor electronics and dimensional metrology. |
