|
U1A
|
Auger spectroscopy
X-ray absorption spectroscopy
| 270-900 eV |
Steven Hulbert
|
|
U2A
|
Infrared microspectroscopy
High Pressure Research
Infrared vibrational spectroscopy
| 30-10000cm-1 (to 40000cm-1 with visible light) |
G Carr
|
|
U2B
|
InSynC - Education
Infrared microspectroscopy
| 500-4000 cm-1 |
Lisa Miller
|
|
U3B
|
| Visible |
Stephen Kramer
|
|
U3C
|
Metrology
| 50-1000 eV |
Kenneth Moy
|
|
U4A
|
Ultraviolet photoelectron spectroscopy
| 10-250 eV |
Joseph Dvorak
|
|
U4B
|
X-ray reflectivity
X-ray scattering, magnetic
X-ray scattering, resonant
Magnetic circular dichroism
X-ray absorption spectroscopy
X-ray fluorescence spectroscopy
| 20-1200 eV |
Dario Arena
|
|
U4IR
|
Infrared microspectroscopy
Infrared transmission and reflection spectroscopy
Time-resolved spectroscopy
| 2 meV to 2.0 eV |
G Carr
|
|
U5
|
| Visible white light |
Stephen Kramer
|
|
U5UA
|
Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
| 15-150 eV |
Elio Vescovo
|
|
U7A
|
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
X-ray photoelectron spectroscopy
| 180-1200 eV |
Daniel Fischer
|
|
U8B
|
Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 100-1000 eV |
Daniel Fischer
|
|
U9B
|
Magnetic circular dichroism
Time-resolved spectroscopy
Ultra violet circular dichroism
Ultraviolet florescence spectroscopy
| 0.8 - 8.0 eV |
Steven Hulbert
|
|
U10B
|
InSynC - Education
Infrared microspectroscopy
| 500-4000 cm-1 |
Lisa Miller
|
|
U11
|
Ultra violet circular dichroism
| 3-10 eV |
Steven Hulbert
|
|
U12A
|
X-ray absorption spectroscopy
X-ray photoelectron spectroscopy
| 100-800 eV |
David Mullins
|
|
U12IR
|
Infrared microspectroscopy
Infrared transmission and reflection spectroscopy
Magnetospectroscopy
THz / millimeter wave spectroscopy
Time-resolved spectroscopy
| 4 meV to 750 meV (30 cm-1 to 6000 cm-1) |
G Carr
|
|
U13UB
|
Ultraviolet photoelectron spectroscopy
Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
| 3-30 eV |
Peter Johnson
|
|
U14B
|
Metrology
| white |
Steven Hulbert
|
|
U15
|
Metrology
| 100-1000 eV |
Steven Hulbert
|
|
X1A1
|
X-ray photoelectron spectroscopy
| .25-.80 keV |
George Flynn
|
|
X1A2
|
X-ray scattering, resonant
| .25-800 keV |
John Hill
|
|
X1B
|
X-ray absorption spectroscopy
X-ray fluorescence spectroscopy
X-ray photoelectron spectroscopy
| .2-1.6 keV |
Peter Abbamonte
|
|
X3A
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
| 4.6-15.1 keV |
Mark Chance
|
|
X3B
|
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
| 3.8-13.5 keV (4.8 - 13 standard) |
Mark Chance
|
|
X4A
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
| 3.5-20 keV |
Wayne Hendrickson
|
|
X4C
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
| 7-20 keV |
Wayne Hendrickson
|
|
X6A
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
| 6.0-23 keV or 2.1 to 0.54 angstroms |
Vivian Stojanoff
|
|
X6B
|
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
| 6.5-19 keV |
Elaine Dimasi
|
|
X7A
|
| White beam |
David Siddons
|
|
X7B
|
X-ray diffraction, single crystal
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, wide angle
| 25-50KeV |
Jose Rodriguez
|
|
X8A
|
Metrology
| 1.0-5.9 keV |
Kenneth Moy
|
|
X8C
|
Transmission x-ray microscope
| 5-11 keV |
Jun Wang
|
|
X9
|
X-ray Scattering, biomolecular solution
X-ray scattering, small angle
X-ray scattering, wide angle
| 2.1-20keV (limted by the detector) |
Lin Yang
|
|
X11A
|
X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 4.5-40 keV |
William O'Grady
|
|
X11B
|
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, near edge structure
| 5.0-23 keV |
William O'Grady
|
|
X12A
|
| 5-50 keV |
David Siddons
|
|
X12B
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
| 5-20 keV |
Dieter Schneider
|
|
X12C
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
| 5.5-20.0 keV |
Robert Sweet
|
|
X13A
|
X-ray scattering, magnetic
X-ray scattering, resonant
Magnetic circular dichroism
| .2-1.6 keV |
Cecilia Sanchez Hanke
|
|
X13B
|
Microdiffraction Imaging
| 9-16 KeV |
Kenneth Evans-Lutterodt
|
|
X14A
|
Multi wavelength anomalous diffraction
X-ray diffraction, powder
X-ray diffraction, single crystal
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray reflectivity
| 6-22 keV |
Jianming Bai
|
|
X15A
|
Diffraction enhanced imaging
| 10-60keV |
Zhong Zhong
|
|
X15B
|
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 1.2-8 keV, standard 2-5 |
Paul Northrup
|
|
X16A
|
Metrology
X-ray inelastic scattering
| |
Zhong Zhong
|
|
X16B
|
X-ray diffraction, powder
X-ray diffraction, single crystal
X-ray reflectivity
X-ray scattering, wide angle
| 7.6 keV |
Christie Nelson
|
|
X16C
|
X-ray diffraction, powder
| 6.5-25 keV |
Peter Stephens
|
|
X17A
|
| |
Lars Ehm
|
|
X17B1
|
X-ray diffraction, powder
| 55 - 100 keV monochromatic / 20-150 keV white |
Zhong Zhong
|
|
X17B2
|
X-ray diffraction, powder
X-ray diffraction, time resolved
High Pressure Research
| Hard X-ray (20-130 keV) |
Zhong Zhong
|
|
X17B2ss
|
High Pressure Research
| Hard X-ray (20-130 keV) |
Zhong Zhong
|
|
X17B3
|
X-ray diffraction, powder
High Pressure Research
| 20-150 keV, 30 and 80 keV monochromatic |
Zhong Zhong
|
|
X17C
|
X-ray diffraction, powder
X-ray diffraction, single crystal
High Pressure Research
| 5-80 keV |
Zhong Zhong
|
|
X18A
|
X-ray diffraction, powder
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
X-ray scattering, wide angle
X-ray absorption spectroscopy
| 5-25 keV |
Steven Ehrlich
|
|
X18B
|
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 4.7-40 keV |
Syed Khalid
|
|
X19A
|
X-ray scattering, resonant
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 2.1-17 keV |
Syed Khalid
|
|
X19C
|
X-ray topography
| 6-40 keV |
Michael Dudley
|
|
X20A
|
X-ray diffraction, single crystal
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
| 4.5-13 keV |
Jean Jordan-Sweet
|
|
X20C
|
X-ray diffraction, time resolved
| 7-11 keV (Si(111));4-11 keV (multilayers) |
Jean Jordan-Sweet
|
|
X21
|
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray scattering, magnetic
X-ray scattering, resonant
X-ray scattering, surface
X-ray scattering, wide angle
| 6-16 keV |
Christie Nelson
|
|
X22A
|
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
X-ray scattering, wide angle
| 10.7 keV (nom) and 32keV |
Nathalie Bouet
|
|
X22B
|
X-ray scattering, liquid
| 8 keV (fixed energy) |
John Hill
|
|
X22C
|
X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray reflectivity
X-ray scattering, resonant
| 3-12 keV |
John Hill
|
|
X23A2
|
X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
| 4.7-30 keV |
Joseph Woicik
|
|
X24A
|
X-ray diffraction, standing waves
Auger spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray photoelectron spectroscopy
| 1.8-6 keV |
Daniel Fischer
|
|
X25
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
| 5-20 keV |
Marc Allaire
|
|
X26A
|
InSynC - Education
Microdiffraction Imaging
X-ray microprobe
| 3-30 keV |
Stephen Sutton
|
|
X26C
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
Ultraviolet photo absorption spectroscopy
| 5-20 keV |
Allen Orville
|
|
X27A
|
X-ray microprobe
| 4.5-32 keV |
Ryan Tappero
|
|
X27B
|
High aspect ratio microsystems technology
| 8 - 40 keV |
Ralph James
|
|
X27C
|
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, small angle
X-ray scattering, wide angle
| 9 KeV |
Tadanori Koga
|
|
X28B
|
X-ray microprobe
| ~7 KeV |
Boris Podobedov
|
|
X28C
|
X-ray Footprinting
| Focused White Beam |
Mark Chance
|
|
X29A
|
Multi wavelength anomalous diffraction
Macromolecular crystallography
| 6-15keV |
Robert Sweet
|
|
X30
|
| |
Boris Podobedov
|
