Electronics & Telecommunications Programs & Projects | |
Seamless and Secure Mobility
Last Updated Date: 10/09/2012 The problem we are facing is how to interconnect a wide variety of heterogeneous and un-interoperable networks including wired and wireless … more
Thin Film X-Ray Reflectometry
Last Updated Date: 10/09/2012 Our goal is to develop Standard Reference Materials (SRMs) and quantitative, reproducible X-ray reflectometry (XRR) data analysis methods to … more
Theory of Transport in Graphene
Last Updated Date: 10/05/2012 Graphene, a single layer of carbon atoms, is one of the most likely materials to produce the next breakthrough in the electronics … more
Future Directions for Magnetic Sensors
Last Updated Date: 10/05/2012 Our goal is to develop the scientific understanding needed to allow modeling and simulation to become the driving force in improving magnetic … more
Magnetic Nanostructures for post-CMOS Electronics
Last Updated Date: 10/05/2012 Our goal is to address the metrology of magnetic effects at the nanoscale level. Nanomagnet arrays form the basis for major data storage … more
Nanoscale Strength Measurements and Standards
Last Updated Date: 10/05/2012 To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more
Nanoscale Stress Measurements and Standards
Last Updated Date: 10/04/2012 Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more
Nanocalorimetry Measurements
Last Updated Date: 10/04/2012 To develop nanocalorimetry as a method for measuring heats of reaction of nanoscale samples with nanojoule sensitivity in order to detect … more
Combinatorial Measurement Methods for Inorganic Materials
Last Updated Date: 10/04/2012 Our goal is to develop novel, combinatorially-compatible measurement methods and metrologies, as well as comprehensive and consistent data sets, … more
700 MHz Band Channel Propagation Model
Last Updated Date: 10/04/2012 To provide telecommunications designers working in public safety communications with channel propagation models to use in simulation and testing. more
Advanced Materials Metrology
Last Updated Date: 10/02/2012 In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the … more
Superconductor Electromechanics
Last Updated Date: 10/02/2012 The Magnetics Group's program in superconductor electromechanics measures the critical current of superconductor wires as a function of … more
Fatigue in Silicon
Last Updated Date: 10/02/2012 Our objective is to evaluate mechanisms of fatigue in bulk silicon, a material that has been traditionally considered to be immune to degradation … more
Energy Determination of X-Ray Transition Energies Using the NIST TES Microcalorimeter Detector
Last Updated Date: 10/02/2012 Previous efforts to produce a comprehensive tabulation of atomic x-ray transition energies have been hampered by the fact that a) detectors having … more
Optical Characterization of Advanced Thin Films
Last Updated Date: 10/02/2012 A wide range of technologies are impacted by the performance of thin (<100 nm) layers of advanced materials. This is particularly true in … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |