For studies of thin-film samples with in-plane structure
The MAGIK reflectometer complements the
Polarized Beam Reflectometer
and the
Horizontal-Geometry Reflectometer
in providing specialized capabilities for measurements of
in-plane scattering
in addition to world-class depth-profiling (with specular reflectivity) of
biological,
battery/electrochemical,
polymer,
and magnetic thin films.
Polarized-beam measurements are possible with the use
of a 3He analyzer.
This instrument is an evolution of the
AND/R reflectometer, which was located on the NG-1 guide. MAGIK is located along the
NG-D guide in the expanded guide hall (part of the NCNR's
Expansion Initiative).