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150 DPI Image
300 DPI Image
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| Title: |
New JILA Apparatus Measures Fast Nanoscale Motions |
| Description: |
This slow-motion simulation of the JILA nanoscale motion detector shows the wiggling of a floppy metal beam, just 100 nanometers thick, as it is struck by an electric current at the dot. Red indicates the greatest change in position from the rest state.
See video
*PHY, JILA
See also http://www.nist.gov/public_affairs/techbeat/tb2007_0316.htm#jila.
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| Subjects (names): |
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| Topics/Categories: |
Quantum Physics--Nanoscale Assembly
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| Type: |
Graphic/illustration/video |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
K. Lehnert/JILA |
| AV Number: |
07PHY010 |
| Date Created: |
March 15, 2007 |
| Date Entered: |
3/16/2007 |
