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S.H. Yang, H. Zhang, M. Nosonovsky and K.-H. Chung, "Effects of contact geometry on pull-off force measurements with a colloidal probe", Langmuir, 24, No.3 (2008) 743-748. S.H. Yang, H. Zhang, M. Nosonovsky and K.-H. Chung, "Nanoscale water capillary bridges under deeply negative pressure", Chemical Physics Letters, 451, Issue 1-3, (2008) 88-92. S.H. Yang, Y. Kim, K.P. Purushothamb, J.-M. Yoo, Y. Choi and N. Dagalakis, “AFM characterization of nanopositioner in-plane stiffnesses”, Sensors and Actuators A, in press, 2010. S.H. Yang, Y. Kim, J.-M. Yoo and N. Dagalakis, "microelectromechanical system based Steward platform with sub-nano resolution," Appl. Phys. Lett., vol 101 061909 (2012). Dr. Seung Ho Yang was elected as a member of American Society of Mechanical Engineers (ASME) in the year 2008. He currently serves as reviewers of many journals; "Nanotechnology", "Journal of Micromechanics and Microengineering", "Measurement Science and Technology", "Journal of Physics D", "Philosophical Transactions of the Royal Society A" and "Sensors and Actuators A." |
Position: Guest Researcher
Intelligent Systems Division Systems Integration Group Employment History:1991 – 1998 Research Scientist, Materials Research Group, SAMSUNG 1994 – 1996 Joint research projects between SAMSUNG and Russian Academy of Science. 1996 – 2002 Student Researcher, Korea Institute of Science and Technology (KIST). 2002 – 2003 Post Doctorial Research Fellow, KIST 2003 – 2007 Guest Researcher, Nanomechanical Properties Group, MSEL, National Institute of Standards and Technology (NIST) 2007 – present Research Associate, Intelligent Systems Div., National Institute of Standards and Technology (NIST) Education:Ph.D, Mechanical Engineering, Yonsei University (2002), South Korea Master of Science, Mechanical Engineering, Yonsei University (1998), South Korea Bachelor of Science, Metallurgical Engineering, Yonsei University (1988), South Korea Contact
Phone: 301-975-8081 |