Face Vendor Recognition Test (FRVT) HomepageFace Recognition Vendor Tests (FRVT) provide independent government evaluations of commercially available and prototype face recognition technologies. These evaluations are designed to provide U.S. Government and law enforcement agencies with information to assist them in determining where and how facial recognition technology can best be deployed. In addition, FRVT results help identify future research directions for the face recognition community. FRVT 2012FRVT 2012 will test state-of-the-art face recognition performance.. It will use very large sets of facial imagery to measure the accuracy and computational efficiency of face recognition algorithms developed in commercial and academic communities worldwide. The test itself will commence in late July 2012 and run through to the end of the year. The detailed plans, procedures and progress of the test are documented on the FRVT 2012 homepage . FRVT 2010A program called FRVT 2010 was never conducted. Instead an equivalent program, the still image track of MBE 2010, was conducted with almost exactly the same goals as an FRVT test. Moreover MBE 2010 instituted the methodologies used in FRVT 2012. FRVT 2006The FRVT 2006 measured performance with sequestered data (data not previously seen by the researchers or developers). A standard dataset and test methodology was employed so that all participants were evenly evaluated. The government provided both the test data and the test environment to participants. The test environment was called the Biometric Experimentation Environment (BEE). The BEE was the FRVT 2006 infrastructure. It allowed the experimenter to focus on the experiment by simplifying test data management, experiment configuration, and the processing of results. FRVT 2002FRVT 2002 consisted of two tests: the High Computational Intensity (HCInt) Test and the Medium Computational Intensity (MCInt) Test. Both test required the systems to be full automatic, and manual intervention was not allowed.
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ContactP. Jonathon Phillips feret@nist.gov |