Advanced High Frequency Devices
Advanced Linear and Nonlinear Optical Metrology in support of next-generation Lithography
Advanced Magnetic and Quantum Materials
Advanced Materials Metrology
Atom-Based Standards and Fabrication
Biomagnetic Imaging Standards and Microsystems
CMOS Device and Reliability
Designing the Nanoworld: Nanostructures, Nanodevices, and Nanooptics
Dimensional Metrology Program
Fabrication and Metrology of Novel Magnetic Tunnel Junctions in the Ultra-thin Barrier Limit
Light-matter Interactions in Semiconductor Nanostructures
MEMS Measurement Science and Standards
Magnetodynamics and Spin Electronics
Mechanical Metrology Program
Metrology for Advanced Bioelectronics
General Information: 301-975-4200 Telephone 301-975-3038 Facsimile
100 Bureau Drive, M/S 8400 Gaithersburg, MD 20899-8400