Photon Sciences   |   Brookhaven National Laboratory

Beamline X18A

  • General Information

    • Source Type
      Bending magnet

      Status
      Operational

      General User Beamtime
      40%

      Energy Range Category
      Hard X-Ray (1-50 keV)

      Energy Range
      5-25 keV

      Beamline Type
      Facility Beamline

      Technique(s)
      X-ray diffraction, powder
      X-ray diffraction, single crystal
      X-ray diffraction, surface
      X-ray diffraction, wide angle
      X-ray reflectivity
      X-ray scattering, surface
      X-ray scattering, wide angle
      X-ray absorption spectroscopy

      Institution(s)
      BNL - CFN
      BNL - Chemistry
      BNL - Chemistry
      BNL - Electrochemistry
      BNL - NSLS
      Oak Ridge National Laboratory
      Pacific Northwest National Laboratory
      UOP LLC
      University of Delaware
      University of Massachusetts
      Yeshiva University

      Research Types
      X-ray diffraction and scattering. X-ray absorption spectroscopy: EXAFS and XANES .
  • Contact Information

    • Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
      Steven Ehrlich, Brookhaven National Laboratory, ehrlich@bnl.gov, 344-7862

      Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
      Steven Ehrlich, Brookhaven National Laboratory, ehrlich@bnl.gov, 344-7862
      Syed Khalid, Brookhaven National Laboratory, khalid@bnl.gov, 344-7496

      Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
      Steven Ehrlich, Brookhaven National Laboratory, ehrlich@bnl.gov, 344-7862

      Beamline Phone
      631-344-5618

  • Instrumentation

    • Beamline Characteristics

      Energy RangeMono Crystal or GratingResolution (ΔE/E)FluxSpot Size (mm)Total Angular Acceptance (mrad)
      5-25 keV Si(111) ~5 x 10-4 ~3 x 1011 ph/sec (@ 10 keV, 235 mA, 2.8 GeV) 1.0H x 0.5V (focused) 6

      Source Type
      Bending magnet

      Optical System
      Monochromator: Si(111) channel cut monochromator with detuning ; located 10.117 meters from the source. Mirror: Cylindrical, rhodium-coated aluminum 1:1 focusing mirror and mirror bender; 700 mm long x 100 mm wide; high energy cutoff is ~25 keV; located 11.75 meters from the source.

      Experimental Apparatus
      Radiation hutch; four-circle Huber diffractometer with crystal analyzer; scintillation detectors; ionization chambers; Si(Li) detector; avalanche photodiode detector; PerkinElmer area detector, 4-element Si-drift Vortex detector and CTI cryostat (available only by special arrangement with the spokesperson).

      Computer System Hardware & Software
      Linux-based personal computer for data acquisition, running EPICS and SPEC; Windows-based computer running XDAC; VME crate; GPIB interfaced temperature controller and digital multimeter.
  • Highlights
    • January, 2011: Combined In Situ X-ray Absorption and Diffuse Reflectance Infrared Spectroscopy: A Novel Tool for Catalytic Investigations
  • Links