FEI Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope)

FEI Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) This is a versatile field emission scanning electron microscope integrated with a focused ion beam column that is used for sophisticated SEM and TEM sample preparation, micromachining, and ultrahigh resolution SEM imaging. The microscope is also equipped for x-ray microanalysis and crystallographic orientation imaging.

Microscope consists of a Hexalens SFEG electron beam column, and a Magnum ion beam column with a gallium liquid metal ion source.
Imaging with both secondary electrons and ions.
Digital image acquisition.
Small, stable, high brightness Schottky based field emission electron source provides 1.5 nm resolution at 30 kV. Three electron beam lens modes – normal imaging, high resolution imaging, and EDS imaging.
Operation at accelerating voltages from 0.2 to 30 kV for electron beam imaging; 10 or 30 kV for ion beam imaging.
Gas injection system for platinum deposition.
Omniprobe Model GPP100 in situ micromanipulator used in the preparation and manipulation of TEM samples.
Inert gas port for removing TEM samples from the DB235 under argon atmosphere for transport to FEI TEM’s.
TSL/EDAX orientation imaging CCD camera system for collecting and analyzing EBSD patterns to determine sample phases, orientation distributions, crystallographic textures, twins and types of grain boundaries, grain size distributions, etc.
EDAX energy dispersive x-ray spectrometer featuring point spectra, elemental line scans and mapping; semiquantitative and quantitative analyses. Can do elemental and crystallographic mapping simultaneously.
“Slice and View” software allows for complete three dimensional structural analysis and characterization.