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INTENSE, FINELY-FOCUSSED ION BEAMS WOULD FIND MANY APPLICATIONS IN RESEARCH AND…

Award Information

Agency:
National Science Foundation
Branch:
N/A
Award ID:
1569
Program Year/Program:
1984 / SBIR
Agency Tracking Number:
1569
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Advanced Technologies/Laboratories Intl
Advanced Technologies/Lab Intl 20010 Century Blvd, Ste 500 Germantown, MD 20874 0111
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Woman-Owned: Yes
Minority-Owned: Yes
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 1984
Title: INTENSE, FINELY-FOCUSSED ION BEAMS WOULD FIND MANY APPLICATIONS IN RESEARCH AND PRODUCTION IF SUFFICIENTLY BRIGHT ION SOURCES COULD BE MADE.
Agency: NSF
Contract: N/A
Award Amount: $38,000.00
 

Abstract:

INTENSE, FINELY-FOCUSSED ION BEAMS WOULD FIND MANY APPLICATIONS IN RESEARCH AND PRODUCTION IF SUFFICIENTLY BRIGHT ION SOURCES COULD BE MADE. THE PROPOSED RESEARCH IS AN INVESTIGATION OF THE FEASIBILITY OF A CONCEPT FOR AN EXTREMELY BRIGHT ION SOURCE WHEREIN AN INTENSE SUPERSONIC MOLECULAR BEAM IS IONIZED AND IONS ARE CAREFULLY EXTRACTED FROM A SYNTHETIC PLASMA. THE TOPICS TO BE INVESTIGATED ARE THE POSSIBLE COMPOSITIONS OF THE MOLECULAR BEAM FOR PRODUCING DESIRED IONS, THE RELATIVE MERITS OF IONIZATION BY PHOTON, ELECTRON, AND ION IMPACT, THE BEHAVIOR OF THE SYNTHETIC PLASMA, AND THE DESIGN OF AN IMPROVED EXTRACTION LENS. THE ION SOURCE COULD BE USED IN COMMERCIAL ION BEAM INSTRUMENTS BOTH FOR THE MICROANALYSIS AND THE MICROFABRICATION OF SURFACES. IN PARTICULAR, THE ION SOURCE WOULD CONTRIBUTE GREATLY TO MAKING ION BEAM LITHOGRAPHY WITH FOCUSSED BEAMS A PRACTICAL TECHNIQUE.

Principal Investigator:

Dr. michael r. mcmillan
SENIOR PHYSICIST
0

Business Contact:

Small Business Information at Submission:

Advanced Technology Labs
19530 Club House Road Gaithersburg, MD 20879

EIN/Tax ID:
DUNS: N/A
Number of Employees: N/A
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No