Alline Myers

Alline Myers is a Process Engineer in the NanoFab Operations Group.  She received a B.S. in Physics from North Carolina State University, an M.S. in Physics from Penn State, and a Ph.D. in Materials Science and Engineering from North Carolina State University.  Alline has extensive experience in materials and nanostructure characterization using field emission scanning transmission electron microscopy, focused ion beam (FIB) systems, and scanning electron microscopy.  After working at NIST as an NRC Postdoctoral Research Associate in the Chemical Science and Technology Laboratory, Alline spent over 10 years in the semiconductor industry, working at Advanced Micro Devices and Spansion, where she applied analytical electron microscopy techniques to the characterization and failure analysis of logic and flash memory devices.   Alline joined the CNST in September 2010, and is responsible for training and assisting NanoFab users on the Titan transmission electron microscope (TEM), optimizing the performance of the TEM, and helping train users on the dual beam FIB systems.