Philips CM30 Transmission Electron Microscope

This is a general purpose TEM equipped for x-ray microanalysis, electron diffraction and conventional imaging.

• High-brightness LaB₆ filament.
• +/- 45° of specimen tilt.
• PGT Avalon 4000 System for energy-dispersive x-ray analysis.
• Point to point resolution of 0.23 nm.