Mid-Atlantic Microbeam Analysis Society 2012 Symposium

Purpose:

A one-half day symposium on the advances to the field in the last 20 years that would have been of great interest to our colleague and friend Chuck Fiori.

Agenda:

“20 Years After Chuck: Progress in Microbeam Analysis Along Fiori’s Trajectories”

Speakers:

1:00 PM Welcome and Opening Remarks: John A. Small (Chief, Surface and Microanalysis Science Division, National Institute of Standards and Technology)

1: 15 - 1:50 Dale E. Newbury (NIST)

“Elemental Mapping with the Silicon Drift Detector EDS: Useful Maps in Seconds; the Impossible in 30 minutes”

1:55 – 2:30 Nicholas W. M. Ritchie (NIST)

“How can we help the SEM-EDS community to make better measurements?”

2:35 – 3:10 Edward Vicenzi (Smithsonian Institution)

“A Microscopy and Microanalytical Examination of Mid-19^th Century Photographs”

3:15 – 3:50 Richard Leapman (National Institutes of Health)

"Development of EELS microanalysis in the biomedical sciences"

Details:

Start Date: Friday, September 14, 2012

End Date: Friday, September 14, 2012

Location: AML Complex Conference Room

Audience: Industry, Government, Academia

Format: Symposium

Sponsor(s):

Surface and Microanalysis Science Division

Mid-Atlantic Microbeam Analysis Society

Registration:

There is no registration fee but registration will be limited to 80 participants. NIST is a secure facility and no walk up registrations will be possible. All attendees including NIST employees must send an e-mail to abigail.lindstrom@nist.gov and indicate if a US citizen. Non-US citizens will be asked for additional information to process their registration.

Registration Contact:

Symposium Organizers

Dale Newbury, dale.newbury@nist.gov, 301-975-3921

Scott Wight, scott.wight@nist.gov, 301-975-3949

Abby Lindstrom, abigail.lindstrom@nist.gov, 301-975-5172