This image is copyrighted by the photographer.
This image may be used for any NIST purpose.
Correct photo credit must be provided.
Other organizations may use this image without charge for
editorial articles that mention NIST in accompanying text or a caption.
Correct photo credit must be provided.
"Stock art" use requires permission and may require payment to the photographer.
To receive a high resolution version send an email with the image AV number and title
to inquiries@nist.gov.
72 DPI Image ©
150 DPI Image ©
300 DPI Image ©
|
| Title: |
AFM |
| Description: |
In an atomic force microscope (AFM), force is measured by a laser beam (yellow in this artist's rendition) bouncing off the diving-board like cantilever. To make an ultrastable AFM, researchers at JILA added two other lasers (green and red) to measure the three dimensional position of both the tip and a reference mark in the sample. These measurements allow researchers to remove drift and vibration in the instrument's measurements caused by environmental factors.
*Physics
Use of the photo as stock art or for editorial purposes not related to NIST, JILA, and the University of Colorado requires permission from the illustrator/university and payment of a use fee.
For non-NIST related use, contact:
Julie Phillips
JILA
Julie_@jila.colorado.edu
303-492-7809
|
| Subjects (names): |
|
| Topics/Categories: |
Physics--Atomic and Molecular Physics
|
| Type: |
Graphic/illustration |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Copyright: G.Kuebler/JILA/CU |
| AV Number: |
09PHY006 |
| Date Created: |
2009 |
| Date Entered: |
3/24/2009 |
