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CMOS Reliability and Advanced Devices Group
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Welcome
The CMOS Reliability and Advanced Devices Group performs research and development for the metrology, test structures, and reference materials required for CMOS and Beyond devices and their constituent materials. THE GROUP
Programs/Projects
Metrology for Advanced Bioelectronics—Using a a "More Than Moore" approach, we are developing electronic chip-based technology for DNA and protein analysis for industry. This research will help revolutionize health care, … Nanoelectronic Device Metrology—The Nanoelectronic Device Metrology Project will develop the required measurement infrastructure and scientific knowledge-base to address technology barriers and enable the successful development … Thin Film Electronics—The Thin Film Electronics Project is developing measurements on active thin film electronic devices like transistors which currently enable user interfaces (sensors, touch pads, displays) in large … CMOS Device and Reliability —The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS devices with sufficient reliability. CMOS (Complementary Metal Oxide Semiconductor) … |
 Contact
Physical Measurement Laboratory (PML) |