Dr. David J. Gundlach

Dr. Gundlach is an electrical engineer in the CMOS Reliability and Advanced Devices Group (683.06) in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). He leads the Thin Film Electronic Device Metrology Project for the Semiconductor Electronics Division at the National Institute of Standards and Technology. His research interests include: active thin film electronic devices, organic electronic and optoelectronic devices, photovoltaic materials and devices, thermal electric materials and devices, novel device/system integration, and display technology.

Dr. Gundlach's research focuses on advancing metrology and measurement methodology to characterize active thin film electronic and optoelectronic devices for macro electronic applications. He has been a P.I. on two Innovations in Measurement Science Programs, and one EEEL Director's Reserve.

Dr. Gundlach is author of over 50 peer reviewed journal articles with citations totaling more than 4500. He is author of more than 130 conference and workshop publications, holds 4 issued patents, and gives invited seminars throughout the world. Dr. Gundlach has co-chaired conference symposium for SPIE, ECS, and MRS, organized several workshops, and organized symposium at the EMC, ISDRS, and IRPS. Most recently, he was the 2009 Technical Program Chair for the Device Research Conference, and the General Conference Chair for 2010. Also in 2010, Dr. Gundlach was co-recipient of the 2010 William P. Slichter Award for strong collaborative interactions with industry to develop the measurements needed to accelerate the commercialization of organic electronics. In 2011, he is the a Technical Program Co-Chair for the Organic Microelectronics and Optoelectronics Workshop. Dr. Gundlach is a member of the IEEE, AVS, and MRS.