Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 117

The Interaction of Radio-Frequency Fields with Dielectric Materials at Macroscopic to Mesoscopic Scales
James Baker-Jarvis, and Sung Kim
http://dx.doi.org/10.6028/jres.117.001

Double-Focusing Thermal Triple-Axis Spectrometer at the NCNR
J. W. Lynn, Y. Chen, S. Chang, Y. Zhao, S. Chi, W. Ratcliff II, B. G. Ueland, and R. W. Erwin
http://dx.doi.org/10.6028/jres.117.002

Standardization of Broadband UV Measurements for 365 nm LED Sources
George P. Eppeldauer
http://dx.doi.org/10.6028/jres.117.004

The Effect of Non-equispaced Sampling Instants, Sub-period Record Epochs, and Timebase Gain on the Information Content of Discretized Replicas of Periodic Signals
N. G. Paulter, Jr.
http://dx.doi.org/10.6028/jres.117.005

NIST Ionization Chamber "A" Sample-Height Corrections
Ryan Fitzgerald
http://dx.doi.org/10.6028/jres.117.003

Fractional diffusion, low exponent Lévy stable laws, and 'slow motion' denoising of helium ion microscope nanoscale imagery
Alfred S. Carasso, and András E. Vladár
http://dx.doi.org/10.6028/jres.117.006

Measurements for the Development of a Simulated Naturally Occurring Radioactive Material
L. Pibida
http://dx.doi.org/10.6028/jres.117.008

A Comparison of Harwell & FWT Alanine Temperature Coefficients From 25 °C to 80 °C
Marc F. Desrosiers, Anne M. Forney, and James M. Puhl
http://dx.doi.org/10.6028/jres.117.007

Computational Seebeck coefficient measurement simulations
Joshua Martin
http://dx.doi.org/10.6028/jres.117.009

Instrument Control (iC) – An Open-Source Software to Automate Test Equipment
K. P. Pernstich
http://dx.doi.org/10.6028/jres.117.010

Lunar Spectral Irradiance and Radiance (LUSI): New Instrumentation to Characterize the Moon as a Space-Based Radiometric Standard
Allan W. Smith, Steven R. Lorentz, Thomas C. Stone, and Raju V. Datla
http://dx.doi.org/10.6028/jres.117.011

Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
Adolfas K. Gaigalas, Lili Wang, Victoria Karpiak, Yu-Zhong Zhang, and Steven Choquette 
http://dx.doi.org/10.6028/jres.117.012