Scanning/Transmission Electron Microscopes
- Nion UltraSTEM 60-100 dedicated aberration-corrected STEM for low- to mid-voltage operation and Enfina EELS
Contact: Juan-Carlos Idrobo, idrobojc@ornl.gov - FEI Titan S 80-300 TEM/STEM with CEOS probe-corrector and EELS/GIF
Contact: Miaofang Chi, chim@ornl.gov - Hitachi HF3300 FEG-TEM/STEM with EDS and EELS/GIF
Contact: Karren More, morekl1@ornl.gov - FEI/Philips CM200 FEG-TEM/STEM with EDS, EELS/EF-TEM
Contact: Chad Parish, parishcm@ornl.gov