NIST Standard Reference Database 20

NIST X-Ray Photoelectron Spectroscopy Database: Version 4.0

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Version 4.0 of the NIST X-ray Photoelectron Spectroscopy Database contains over 29,000 data records, an increase of 6,844 data records from Version 3.4. For the newly added records, considerable information is supplied about the specimen materials (e.g., specimen morphology and methods of specimen preparation, processing, and characterization), XPS measurement conditions (e.g., type of X-ray source and whether an X-ray monochromator was utilized), and XPS data analysis (e.g., background-subtraction method, peak-location method, and line widths).

The new data records originated from an evaluation of over 5,000 scientific papers that were published generally between 1993 and 1996. Data are given for the positions of photoelectron lines, chemical shifts, doublet splittings, and surface and interface core-level shifts. In addition, data are provided for the kinetic energies of Auger lines measured in an XPS spectrum and for Auger parameters.

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Pricing Information: NIST X-ray Photoelectron Spectroscopy Database (SRD20) Version 4.0

Individual License - Individual License $500.00

Small Institution - Small Institution (2 to 500 users) $800.00

Medium Institution - Medium Institution (501 to 2000 users) $1100.00

Large Institution - Large Institution (2001+ users) $1500.00

For more information on NIST X-Ray Photoelectron Spectroscopy Database: Version 4.0 contact:

The scientific contact is:

Cedric Powell CSTL - Surface and Microanalysis Science Division (837) National Institute of Standards and Technology 100 Bureau Dr., Stop 8370 Gaithersburg, MD 20899-8370 (301) 975-2534 cedric.powell@nist.gov

Keywords: photoelectron, spectroscopy, spectral lines, materials, chemistry, line energy, chemical shifts, chemical splittings, Auger kinetic energies.