Proximal Probes Facility
Managed by the Interface Science and Catalysis Group (contact:
Peter Sutter)
The Interface Science and Catalysis Group operates a comprehensive suite
of state-of-the-art instruments for microscopy, spectroscopy, and probing of
nanostructured surfaces and surface-supported nanostructures. Capabilities
include atomic-resolution surface microscopy and spectroscopy, probing and
mapping of electrical and optical properties, and real-time imaging and
spectroscopy of surfaces during chemical reactions or nanostructure growth.
The instruments span the range between complex systems operating in
ultrahigh vacuum (UHV) and characterization tools for operation in air or in
controlled ambient. The UHV instruments are equipped for in-situ sample
preparation and modification, and for routine characterization by
diffraction and electron and ion spectroscopy techniques. Each ambient
instrument enables multiple measurement techniques to serve a broad range of
User needs.
Capabilities
Low-energy electron microscopy & photoelectron microscopy
Contact: Jerzy Sadowski
- Elmitec LEEM V field-emission low-energy electron microscope for
in-situ microscopy of dynamic surface processes. Micro-diffraction
capability. Operation at variable temperature (200 K to over 1500 K),
and at pressures from UHV to about 10-6 torr.
- Elmitec LEEM III low-energy electron microscope, coupled to
vacuum-UV beamline U5UA at the National Synchrotron Light Source, for
time-resolved and spectroscopic surface microscopy, photoelectron
microscopy and spectroscopy (photon energy range: 20 – 200 eV),
micro-diffraction.
Probing of transport and photoelectric properties of single
nanostructures
Contact: Peter Sutter
- Omicron Nanotechnology
4-Point Nanoprobe with Zeiss Gemini UHV field-emission scanning electron
microscope, scanning Auger microscopy spectroscopy, integrated Orsay Physics
UHV focused ion beam system, and low-energy electron diffraction.
- Attocube confocal
microscope for operation in He exchange gas at variable temperature (4 K to
300 K) in magnetic fields up to 10 T.
UHV and elevated pressure microscopy & spectroscopy
Contact: David Starr
- RHK Technology UHV 7500
variable temperature UHV atomic force and scanning tunneling microscope
equipped for operation in UHV as well as in reactive gases at pressures up
to ~10 torr; preparation chamber equipped with low-energy electron
diffraction, x-ray photoelectron spectroscopy, and ion scattering
spectroscopy.
- Currently under
construction: High-pressure photoelectron spectroscopy end station at the
National Synchrotron Light Source, for XPS and UPS at pressures up to ~10 torr; UHV sample preparation and characterization in an attached preparation
chamber.
Cryogenic scanning tunneling microscopy
Contact: Peter Sutter
- Createc low-temperature
UHV scanning tunneling microscope for operation with liquid helium (T ~ 5 K)
or liquid nitrogen (T ~ 80 K) cooling; high-resolution microscopy,
ultrastable tunneling spectroscopy, single atom and molecule manipulation.
Sample preparation chamber equipped with liquid helium cooled manipulator
and low-energy electron diffraction.
Scanning probe and optical microscopes for operation in air and
controlled ambient
Contact: Xiao Tong
- Veeco Multimode V
scanning probe microscope for operation at variable temperature in air,
controlled ambients, and fluids. Special cell for electrochemical scanning
tunneling microscopy.
- WiTec Alpha combination
microscope for atomic force microscopy, scanning near-field optical
microscopy, confocal microscopy, and confocal Raman microscopy within the
same field of view. Two laser excitation sources (633 nm and 532 nm) for
confocal and confocal Raman microscopy. Operation between room temperature
and 200°C.
Last Modified: July 2, 2012 Please forward all questions about this site to:
Pam Ciufo.
June
19, 2012
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